Polarized focal adhesion kinase activity within a focal adhesion during cell migration von Li, Xiaoquan, Combs, Joseph Dale, Salaita, Khalid, Shu, Xiaokun

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The (13)C amide I band is still sensitive to conformation change when the regular amide I band cannot be distinguished at the typical position in H2O von Li, Shanghao, Combs, Joseph Dale, Alharbi, Olaa Eid, Kong, Jing, Wang, Chengshan, Leblanc, Roger M

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The 13C amide I band is still sensitive to conformation change when the regular amide I band cannot be distinguished at the typical position in H2OElectronic supplementary informat... von Li, Shanghao, Combs, Joseph Dale, Alharbi, Olaa Eid, Kong, Jing, Wang, Chengshan, Leblanc, Roger M

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The super(13)C amide I band is still sensitive to conformation change when the regular amide I band cannot be distinguished at the typical position in H sub(2)O von Li, Shanghao, Combs, Joseph Dale, Alharbi, Olaa Eid, Kong, Jing, Wang, Chengshan, Leblanc, Roger M

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The 13 C amide I band is still sensitive to conformation change when the regular amide I band cannot be distinguished at the typical position in H 2 O von Li, Shanghao, Combs, Joseph Dale, Alharbi, Olaa Eid, Kong, Jing, Wang, Chengshan, Leblanc, Roger M.

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Measuring Integrin Force Loading Rates Using a Two-Step DNA Tension Sensor von Combs, J. Dale, Foote, Alexander K., Ogasawara, Hiroaki, Velusamy, Arventh, Rashid, Sk Aysha, Mancuso, Joseph Nicholas, Salaita, Khalid

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Crowd-sourced machine learning prediction of long COVID using data from the National COVID Cohort Collaborative von Loomba, Johanna, Pfaff, Emily, Mitchell, Elliot, Delong, Grant, Tariq, Adbul, Coyle, Jeremy, Mertens, Andrew, Hubbard, Alan, Gao, Jifan, Li, Ziyang, Holmes, John, Wong, Eric, Getzen, Emily, Al-Amery, Amera, Anand, Adit, Baghbanzadeh, Mahdi, Bangert, Bridget, Butzin-Dozier, Zachary, Chiang, Jeffrey, Dai, Zongyu, Deng, Kaiwen, Dinh, Dong, Fu, Sunyang, Gardner, Kelly, Ghalwash, Mohamed, Ham, Colby, Hanoudi, Samer, Hershkovich, Leeor, Huang, Jiani, Huang, Yu, Hur, Junguk, Ismail, Hamid, Izmirlian, Grant, Jang, Kuk, Kartoun, Uri, Krichevsky, Spencer, Larie, Dale, Lederer, Lauren, Liu, Feifan, Munia, Tamanna, Madhira, Vithal, Mansourifard, Farzaneh, Milo, Christopher, Musal, Rasim, Narain, Rohan, Peng, Le, Perkins, Diana, Poplavskiy, Dmytro, Pungitore, Sarah, Ravichandran, Sarangan, Reyes, Abel, Rouffa, Sean, Sawant, Sahil, Schiaffino, Melody, Sengupta, Saurav, Shalaev, Ruslan, Shi, Seraphina, Shinguyen, Linh, Strube, Jan, Sundararajan, Prathic, Tawiah, Edward, Walzer, Benjamin, Wang, Lu, Wu, Yifeng, Xia, Fangfang, Yin, Changyu, Zanaj, Martin, Zhao, Zixuan, Zhou, Andrea, Zhu, Yuanda, Bates, Benjamin, Beasley, Will, Bramante, Carolyn, Brown, Don, Burgoon, Penny, Buse, John, Fuentes, Rafael, Gabriel, Davera, Gagnier, Joel, Gersing, Kenneth, Girvin, Andrew, Hurley, Robert, Johnson, Steve, Koraishy, Farrukh, Kostka, Kristin, Mariona, Federico, Marti, Emily, Martin, Greg, Mehta, Hemalkumar, Miller, Robert, Northington, Lavance, O’Neil, Shawn, Patel, Brijesh, Patel, Rena, Portilla, Lili, Sokos, George, Suver, Christine, Walden, Anita, Walters, Kellie, Zhu, Richard

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Comparative studies of active site–ligand interactions among various recombinant constructs of human β-amyloid precursor protein cleaving enzyme von Kopcho, Lisa M, Ma, Jianhong, Marcinkeviciene, Jovita, Lai, Zhihong, Witmer, Mark R, Cheng, Janet, Yanchunas, Joseph, Tredup, Jeffrey, Corbett, Martin, Calambur, Deepa, Wittekind, Michael, Paruchuri, Manjula, Kothari, Dharti, Lee, Grace, Ganguly, Subinay, Ramamurthy, Vidhyashankar, Morin, Paul E, Camac, Daniel M, King, Robert W, Lasut, Amy L, Harold Ross, O, Hillman, Milton C, Fish, Barbara, Shen, Keqiang, Dowling, Randine L, Kim, Young B, Graciani, Nilsa R, Collins, Dale, Combs, Andrew P, George, Henry, Thompson, Lorin A, Copeland, Robert A

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Per-pin integrated circuit test system having for each pin an N-bit interface von COMBS, MICHAEL LEE, GRUODIS, ALGIRDAS JOSEPH, PUNTAR, CHARLES ALBERT, SZABO, KURT PAUL, HOFFMAN, DALE EUGENE

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PER-PIN INTEGRATED CIRCUIT TEST SYSTEM HAVING FOR EACH PIN AN N-BIT INTERFACE von COMBS, MICHAEL LEE, GRUODIS, ALGIRDAS JOSEPH, PUNTAR, CHARLES ALBERT, SZABO, KURT PAUL, HOFFMAN, DALE EUGENE

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Per-pin integrated circuit test system having for each pin an N-bit interface von COMBS, MICHAEL LEE, GRUODIS, ALGIRDAS JOSEPH, PUNTAR, CHARLES ALBERT, SZABO, KURT PAUL, HOFFMAN, DALE EUGENE

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Schaltungsprüfsystem mit einer Schnittstelle von N-bit pro Stift von COMBS, MICHAEL LEE, POUGHQUAG NY. 12570, US, HOFFMAN, DALE EUGENE, STORMVILLE NY. 12582, US, PUNTAR, CHARLES ALBERT, HOPEWELL JUNCTION NY. 12533, US, SZABO, KURT PAUL, FISHKILL NY. 12524, US, GRUODIS, ALGIRDAS JOSEPH, WAPPINGERS FALLS NY. 12590, US

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