Automatic feature selection in EUV scatterometry von Ansuinelli, Paolo, Coene, Wim M J, Urbach, H P

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Improved ptychographic inspection of EUV reticles via inclusion of prior information von Ansuinelli, Paolo, Coene, Wim M. J., Urbach, H. Paul

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Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography von Wei, Xukang, Urbach, H. Paul, van der Walle, Peter, Coene, Wim M.J.

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Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry von Kumar, Nitish, Petrik, Peter, Ramanandan, Gopika K P, El Gawhary, Omar, Roy, Sarathi, Pereira, Silvania F, Coene, Wim M J, Urbach, H Paul

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Cramer-Rao lower bound and maximum-likelihood estimation in ptychography with Poisson noise von Wei, Xukang, Urbach, H. Paul, Coene, Wim M. J.

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Thermal Deformation Prediction in Reticles for Extreme Ultraviolet Lithography Based on a Measurement-Dependent Low-Order Model von Bikcora, Can, Weiland, Siep, Coene, Wim M. J.

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Fast semi-analytical solution of Maxwell's equations in Born approximation for periodic structures von Pisarenco, Maxim, Quintanilha, Richard, van Kraaij, Mark G M M, Coene, Wim M J

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Wafer-based aberration metrology for lithographic systems using overlay measurements on targets imaged from phase-shift gratings von van Haver, Sven, Coene, Wim M J, D'havé, Koen, Geypen, Niels, van Adrichem, Paul, de Winter, Laurens, Janssen, Augustus J E M, Cheng, Shaunee

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Lens Heating Induced Aberration Prediction via Nonlinear Kalman Filters von Bikcora, Can, van Veelen, M., Weiland, S., Coene, W. M. J.

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Nonlinear signal-processing model for scalar diffraction in optical recording von Coene, Wim M J

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Scalar diffraction modeling in optical disk recording using wave function assembling von Yin, Bin, Coene, Wim M J, Hekstra, Andries P

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Sequence Detection Based on a Variable State Trellis for Multidimensional ISI Channels von Moinian, A., Fagoonee, L., Coene, W.M.J., Honary, B.

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Refinements of Multi-Track Viterbi Bit-Detection von Hekstra, A.P., Coene, W.M.J., Immink, A.H.J.

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Performance Investigation of Soft-Decodable Runlength-Limited Codes With Different Minimum Runlength Constraints in High-Density Optical Recording von Haibin Zhang, Hekstra, A.P., Coene, W.M.J., Bin Yin

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Nonlinear signal-processing model for signal generation in multilevel two-dimensional optical storage von Fagoonee, Lina, Coene, Wim M J, Moinian, Abdolhosein, Honary, Bahram

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Modeling and compensation of asymmetry in optical recording von Pozidis, H., Bergmans, J.W.M., Coene, W.M.J.

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Two-Dimensional Optical Storage: High-Speed Read-Out of a 50 GByte Single-Layer Optical Disc with a 2D Format Using λ=405 nm and NA=0.85 von Bruls, Dominique M., Immink, Andre H. J., Lee, Alexander M. van der, Coene, Wim M. J., Riani, Jamal, Beneden, Steven J. L. van, Ciacci, Massimo, Bergmans, Jan W. M., Furuki, Motohiro

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Reduced-order modeling of thermally induced deformations on reticles for extreme ultraviolet lithography von Bikcora, Can, Weiland, Siep, Coene, Wim M. J.

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High-resolution imaging on a field emission TEM von Otten, Max T., Coene, Wim M.J.

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Blue phase-change recording at high data densities and data rates von Dekker, Martijn K, Pfeffer, Nicola, Kuijper, Maarten, Ubbens, Igolt P, Coene, Wim M. J, Meinders, E. R, Borg, Herman J

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