A method for rigid body expansion measurement in the presence of secondary grain boundary dislocations applied to a SrTiO3 grain boundary von Dudeck, K.J., Cockayne, D.J.H.

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A method for rigid body expansion measurement in the presence of secondary grain boundary dislocations applied to a SrTiO 3 near- Σ 3 ( 1 1 2 ) grain boundary von Dudeck, K.J., Cockayne, D.J.H.

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An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging von Anderson, S.C., Birkeland, C.R., Anstis, G.R., Cockayne, D.J.H.

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Reduced density function analysis using convergent electron illumination and iterative blind deconvolution von McBride, W.E., Cockayne, D.J.H., Goringe, C.M.

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Mechanism of dopant distribution: An example of nickel-doped ceria nanoparticles von Shih, Shao-Ju, Li, Guoqiang, Cockayne, David J.H., Borisenko, Konstantin B.

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Island shape instabilities and surfactant-like effects in the growth of InGaAs/GaAs quantum dots von Leon, R., Lobo, C., Liao, X.Z., Zou, J., Cockayne, D.J.H., Fafard, S.

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The effect of structural changes on ELNES for C 60 von Nicholls, R.J., Nguyen-Manh, D., Cockayne, D.J.H., Lazar, S.

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Electron energy loss spectra of C60 and C70 fullerenes von Lee, S.M., Nicholls, R.J., Nguyen-Manh, D., Pettifor, D.G., Briggs, G.A.D., Lazar, S., Pankhurst, D.A., Cockayne, D.J.H.

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The formation of Pt8Cr in Pt 10at.% Cr von Nzula, M.P., Lang, C.I., Cockayne, D.J.H.

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The structure of nanovolumes of amorphous materials von McBride, W., Cockayne, D.J.H.

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A concerted rational crystallization/amorphization mechanism of Ge(2)Sb(2)Te(5) von Borisenko, K B, Chen, Y, Song, S A, Nguyen-Manh, D, Cockayne, D.J.H.

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Electron energy loss spectra of C 60 and C 70 fullerenes von Lee, S.M., Nicholls, R.J., Nguyen-Manh, D., Pettifor, D.G., Briggs, G.A.D., Lazar, S., Pankhurst, D.A., Cockayne, D.J.H.

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Ion implantation in 4H–SiC von Wong-Leung, J., Janson, M.S., Kuznetsov, A., Svensson, B.G., Linnarsson, M.K., Hallén, A., Jagadish, C., Cockayne, D.J.H.

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Surface relaxation of strained heterostructures revealed by Bragg line splitting in LACBED patterns von Chou, C.T., Anderson, S.C., Cockayne, D.J.H., Sikorski, A.Z., Vaughan, M.R.

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Interfacial structure in silicon nitride sintered with lanthanide oxide von DWYER, C, ZIEGLER, A, COCKAYNE, D. J. H, RITCHIE, R. O, PENNYCOOK, S. J, SHIBATA, N, WINKELMAN, G. B, SATET, R. L, HOFFMANN, M. J, CINIBULK, M. K, BECHER, P. F, PAINTER, G. S, BROWNING, N. D

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Structural and compositional comparison of Si3N4 ceramics with different fracture modes von Döblinger, M., Winkelman, G.B., Dwyer, C., Marsh, C., Kirkland, A.I., Cockayne, D.J.H., Hoffmann, M.J.

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Self-organization of nanoneedles in Fe∕GaAs (001) epitaxial thin film von Huang, Y. Z., Wang, S. G., Wang, C., Xie, Z. B., Cockayne, D. J. H., Ward, R. C. C.

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Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination von McBride, W., Cockayne, D.J.H., Nguyen-Manh, D.

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Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis von Anstis, G.R., Cai, D.Q., Cockayne, D.J.H.

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Self-organized amorphous material in silicon (0 0 1) by focused ion beam (FIB) system von Huang, Y., Cockayne, D.J.H., Marsh, C., Titchmarsh, J.M., Petford-Long, A.K.

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