Extracting inter-diffusion parameters of TiC from AES depth profiles von Swart, H.C., Jonker, A.J., Claassens, C.H., Chen, R., Venter, L.A., Ramoshebe, P., Wurth, E., Terblans, J.J., Roos, W.D.

Volltext

The apparent effect of sample surface damage on the dielectric parameters of GaAs von Engelbrecht, J.A.A., Hashe, N.G., Hillie, K.T., Claassens, C.H.

Volltext

Adaptation of Akkermansia muciniphila to the Oxic-Anoxic Interface of the Mucus Layer von Ouwerkerk, Janneke P, van der Ark, Kees C H, Davids, Mark, Claassens, Nico J, Finestra, Teresa Robert, de Vos, Willem M, Belzer, Clara

Volltext