A Statistical Technique to Measure the Proportion of MBU's in SEE Testing von Chugg, A.M., Moutrie, M.J., Burnell, A.J., Jones, R.

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Broadening of the variance of the number of upsets in a read-cycle by MBUs von Chugg, A.M., Moutrie, M.J., Jones, R.

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Single particle dark current spikes induced in CCDs by high energy neutrons von Chugg, A.M., Jones, R., Moutrie, M.J., Armstrong, J.R., King, D.B.S., Moreau, N.

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Analyses of CCD images of nucleon-silicon interaction events von Chugg, A.M., Jones, R., Moutrie, M.J., Dyer, C.S., Ryden, K.A., Truscott, P.R., Armstrong, J.R., King, D.B.S.

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Laser Simulation of single event effects in pulse width Modulators von Chugg, A.M., Jones, R., Moutrie, M.J., Duncan, P.H., Sorensen, R.H., Mattsson, S., Larsson, S., Fitzgerald, R., O'Shea, T.

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The Random Telegraph Signal Behavior of Intermittently Stuck Bits in SDRAMs von Chugg, A.M., Burnell, A.J., Duncan, P.H., Parker, S., Ward, J.J.

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Probing the charge-collection sensitivity profile using a picosecond pulsed laser at a range of wavelengths von Chugg, A.M., Jones, R., Moutrie, A., Dyer, C.S., Sanderson, C., Wraight, A.

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Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility von Jones, R., Chugg, A.M., Jones, C.M.S., Duncan, P.H., Dyer, C.S., Sanderson, C.

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Laser SEE Sensitivity Mapping of SRAM Cells von Chugg, A.M., Burnell, A.J., Moutrie, M.J., Jones, R., Harboe-Sorensen, R.

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A CCD miniature radiation monitor von Chugg, A.M., Jones, R., Jones, P., Nieminen, P., Mohammadzadeh, A., Robbins, M.S., Lovell, K.

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Analyses of images of neutron interactions and single particle displacement damage in CCD arrays von Chugg, A.M., Jones, R., Moutrie, M.J., Truscott, P.R.

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Probing the Nature of Intermittently Stuck Bits in Dynamic RAM Cells von Chugg, A M, McIntosh, J, Burnell, A J, Duncan, P H, Ward, J

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Laser Simulation of SEE Due to Localized Ionization in Dielectric Structures von Chugg, A.M., English, R., Parker, S., Burnell, A.J.

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Webcam observations of SEE events at the Jungfraujoch research station von Burnell, A.J., Chugg, A.M.

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Improved fine-scale laser mapping of component SEE sensitivity von Chugg, A. M., Ward, J., McIntosh, J., Flynn, N., Duncan, P. H., Barber, T. S., Poivey, C.

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Laser SEL sensitivity mapping of SRAM cells von Burnell, A. J., Chugg, A. M., Harboe-Sorensen, R.

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Laser simulation of SEE due to localized ionization in dielectric structures von Chugg, A M, English, R, Parker, S, Burnell, A J

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Application of charge-coupled devices to multiple-bit-upset analysis in radiation environments von Platt, S.P., Torok, Z., Chugg, A.M., Moutrie, M.J., Burnell, A.J.

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Analyses of CCD images of nucleon-silicon interaction events von Chugg, A.M., Jones, R., Moutrie, M.J., Dyer, C.S., Ryden, K.A., Truscott, P.R., Armstrong, J.R., King, D.B.S.

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A CCD miniature radiation monitor von Chugg, A.M., Jones, R., Jones, P., Nieminen, P., Mohammadzadeh, A., Robbins, M.S., Lovell, K.

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