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Calibration and electric characterization of p-MNOS RADFETs at different dose rates and temperatures von Zimin, P.A., Mrozovskaya, E.V., Chubunov, P.A., Anashin, V.S., Zebrev, G.I.

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Calibration and electric characterization of p-MNOS RADFETs at different dose rates and temperatures von Zebrev, G. I, Zimin, P. A, Mrozovskaya, E. V, Chubunov, P. A, Anashin, V. S

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Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters von Zebrev, G. I, Zimin, P. A, Mrozovskaya, E. V, Yushkova, V. A, Anashin, V. S, Chubunov, P. A

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Calibration and electric characterization of p-MNOS RADFETs at different dose rates and temperatures von Zebrev, G I, Zimin, P A, Mrozovskaya, E V, Chubunov, P A, Anashin, V S

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Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters von Zebrev, G I, Zimin, P A, Mrozovskaya, E V, Yushkova, V A, Anashin, V S, Chubunov, P A

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