Raman spectroscopic measurements and imaging on sub-newton Berkovich and spherical imprints in fused silica von Gerbig, Y.B., Michaels, Chris A.

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Determination of residual stress distributions in polycrystalline alumina using fluorescence microscopy von Michaels, Chris A., Cook, Robert F.

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In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films von Gerbig, Yvonne B., Michaels, Chris A., Cook, Robert F.

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Residual stress in polycrystalline alumina: Comparison of two-dimensional maps and integrated scans in fluorescence-based measurements von Michaels, Chris A., Cook, Robert F.

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In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films von Gerbig, Yvonne B., Michaels, Chris A., Cook, Robert F.

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Review: Coefficients for Stress, Temperature, and Composition Effects in Fluorescence Measurements of Alumina von Cook, Robert F, Michaels, Chris A

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Stress Measurements in Alumina by Optical Fluorescence: Revisited von Cook, Robert F, Michaels, Chris A

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Surface-sensitive Raman microscopy with total internal reflection illumination von Michaels, Chris A.

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Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopy von Gayle, Andrew J., Friedman, Lawrence H., Beams, Ryan, Bush, Brian G., Gerbig, Yvonne B., Michaels, Chris A., Vaudin, Mark D., Cook, Robert F.

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Stress mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy von Myers, Grant A., Hazra, Siddharth S., de Boer, Maarten P., Michaels, Chris A., Stranick, Stephan J., Koseski, Ryan P., Cook, Robert F., DelRio, Frank W.

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Depth profiling using C60+ SIMS : Deposition and topography development during bombardment of silicon von GILLEN, Greg, BATTEAS, James, MICHAELS, Chris A, CHI, Peter, SMALL, John, WINDSOR, Eric, FAHEY, Albert, VERKOUTEREN, Jennifer, KIM, K. J

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Fourier Transform Spectrometry with a Near-Infrared Supercontinuum Source von Michaels, Chris A., Masiello, Tony, Chu, Pamela M.

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Earrings Visual Project Guide: Step-by-Step Instructions for 30 Gorgeous Designs von Michaels, Chris Franchetti

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Quantitative mapping of stress heterogeneity in polycrystalline alumina using hyperspectral fluorescence microscopy von Myers, Grant A., Michaels, Chris A., Cook, Robert F.

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Comparison of the sensitivity and image contrast in spontaneous Raman and coherent Stokes Raman scattering microscopy of geometry-controlled samples von Kim, Hyunmin, Michaels, Chris A, Bryant, Garnett W, Stranick, Stephan J

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Surface Selective Raman Microscopy With Total Internal Reflection Illumination von Michaels, Chris A

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Modulus and Chemical Mapping of Multilayer Coatings von Forster, Aaron M, Michaels, Chris A, Sung, Lipiin, Lucas, Justin

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Coherent stokes scattering from gold nanorods: critical dimensions and multicolor near-resonant plasmon excitation von Kim, Hyunmin, Herzing, Andrew, Michaels, Chris A, Bryant, Garnett W, Stranick, Stephan J

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Surface plasmon polariton Raman microscopy von Yoo, Hae-Wook, Richter, Lee J., Jung, Hee-Tae, Michaels, Chris A.

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Probing photodegradation beneath the surface : a depth profiling study of UV-degraded polymeric coatings with microchemical imaging and nanoindentation von XIAOHONG GU, MICHAELS, Chris A, DRZAL, Peter L, JASMIN, Joan, MARTIN, David, NGUYEN, Tinh, MARTIN, Jonathan W

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