Highly photosensitive MIS structure with embedded silicon film for solar cell and photodetection applications von Chouaib, H., Aouassa, M., Bouabdellaoui, M.

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Synthesis, crystal structure, thermal analysis and dielectric properties of (C8H12N)3SnCl6.Cl compound von Chouaib, H., Elfaleh, N., Karoui, S., Kamoun, S., Graça, M.P.F.

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Thermal analysis, AC conductivity and dielectric relaxation in Bis(2-methoxyanilinium) hexabromidostannate(IV) dihydrate: (C7H10NO)2SnBr6·2H2O von Chouaib, H., Karoui, S., Kamoun, S.

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Note: A signal-to-noise ratio enhancement based on wafer light irradiation system for optical modulation spectroscopy measurement von Chouaib, H., Kelly, P. V.

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Hysterical pseudo-coma: A case report von Chouaib, N, Chouaib, H, Belyamani, L, Otheman, Y, Bichra, M Z

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A micro-optical modulation spectroscopy technique for local strain measurement von Chouaib, H., Murtagh, M. E., Kelly, P. V.

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AC conductivity analysis and dielectric relaxation behavior of (C6H20N3)BiBr6.H2O von Elfaleh, Nizar, Chouaib, H., Kamoun, S., Graça, M. P. F.

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AC conductivity and dielectric relaxation of tris(N,N-dimethylanilinium) hexabromidostannate(IV) bromide: (C8H12N)3SnBr6.Br von Chouaib, H., Kamoun, S.

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Rapid photoreflectance spectroscopy for strained silicon metrology von Chouaib, H., Murtagh, M. E., Guènebaut, V., Ward, S., Kelly, P. V., Kennard, M., Le Vaillant, Y. M., Somekh, M. G., Pitter, M. C., Sharples, S. D.

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Rhinocerebral mucormycosis in central tunisia: A study of 20 cases von Ajmi, M., Yaacoub, A., Chouaib, H., Ismail, S., Bellakhdhar, M., Garrouche, A., Abdelkefi, M., Fathallah, A.

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Strain dependence of the direct energy bandgap in thin silicon on insulator layers von Munguía, J, Bluet, J-M, Chouaib, H, Bremond, G, Mermoux, M, Bru-Chevallier, C

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Photoreflectance study of GaAsSb ∕ InP heterostructures von Chouaib, H., Bru-Chevallier, C., Guillot, G., Lahreche, H., Bove, P.

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Photoreflectance spectroscopy for the study of GaAsSb/InP heterojunction bipolar transistors von Bru-Chevallier, C., Chouaib, H., Arcamone, J., Benyattou, T., Lahreche, H., Bove, P.

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Local micro-photoreflectance spectroscopy measurements on type II InGaAlAs/GaAsSb/InP heterojunction bipolar transistor: Correlation with electrical characteristics von Chouaib, H., Bru-Chevallier, C.

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Synthesis, crystal structure, thermal analysis and dielectric properties of (C 8 H 12 N) 3 SnCl 6 .Cl compound von Chouaib, H., Elfaleh, N., Karoui, S., Kamoun, S., Graça, M.P.F.

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Photoreflectance study at the micrometer scale von Bru-Chevallier, C., Chouaib, H., Bakouboula, A., Benyattou, T.

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Photoreflectance spectroscopy of self-organized InAs/InP(0 0 1) quantum sticks emitting at 1.55 μm von Chouaib, H., Chauvin, N., Bru-Chevallier, C., Monat, C., Regreny, P., Gendry, M.

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Synthesis, crystal structure and electrical properties of N,N-dimethylanilinium trichloridostannate (II): (C8H12N)SnCl3 von Chouaib, H., Kamoun, S., Costa, L.C., Graça, M.P.F.

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Optical strain measurement in ultrathin sSOI wafer von Munguía, J., Chouaib, H., de la Torre, J., Bremond, G., Bru-Chevallier, C., Sibai, A., Champagnon, B., Moreau, M., Bluet, J.-M.

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AC conductivity analysis and dielectric relaxation behavior of (C 6 H 20 N 3 )BiBr 6 .H 2 O von Elfaleh, Nizar, Chouaib, H., Kamoun, S., Graça, M. P. F.

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