Perceived parental psychological control and behavioral control among emerging adults: A cross-cultural study between the U.S. and Taiwan von Chou, Catherine P., Chou, Elizabeth Pei Ting

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Angular color shift of micro-LED displays von Gou, Fangwang, Hsiang, En-Lin, Tan, Guanjun, Chou, Pei-Ting, Li, Yun-Li, Lan, Yi-Fen, Wu, Shin-Tson

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Transient Analysis of Partial Thermal Characteristics of Multistructure Power LEDs von WANG, Chien-Ping, CHEN, Tzung-Te, FU, Han-Kuei, CHANG, Tien-Li, CHOU, Pei-Ting

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The Study of Spectral Correction Algorithm of Charge-Coupled Device Array Spectrometer von Fu, Han-Kuei, Liu, Yen-Liang, Chen, Tzung-Te, Wang, Chien-Ping, Chou, Pei-Ting

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Analysis of Thermal Resistance Characteristics of Power LED Module von Wang, Chien-Ping, Kang, Shung-Wen, Lin, Kuan-Min, Chen, Tzung-Te, Fu, Han-Kuei, Chou, Pei-Ting

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Inference From Lumen Degradation Data Under Wiener Diffusion Process von Tsai, Tzong-Ru, Lin, Chin-Wei, Sung, Yi-Ling, Chou, Pei-Ting, Chen, Chiu-Ling, Lio, Yuhlong

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Analysis of thermal characteristics and mechanism of degradation of flip-chip high power LEDs von Wang, Chien-Ping, Chen, Tzung-Te, Fu, Han-Kuei, Chang, Tien-Li, Chou, Pei-Ting, Chu, Mu-Tao

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Study of Different Testing Methods Used in UV-LED Optical Measurement von Chou, Pei-Ting, Ying, Shang-Ping, Chen, Tzung-Te, Lee, Chih-Kung

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Low-Frequency Noise Analysis of Electrostatic Discharge Tolerance of InGaN Light-Emitting Diodes von CHEN, Tzung-Te, FU, Han-Kuei, DAI, Chun-Fan, WANG, Chien-Ping, CHU, Chun-Wen, CHOU, Pei-Ting

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Investigation of dynamic color deviation mechanisms of high power light-emitting diode von Fu, Han-Kuei, Lin, Chin-Wei, Chen, Tzung-Te, Chen, Chiu-Ling, Chou, Pei-Ting, Sun, Chien-Jen

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Measurement of LED chips using a large-area silicon photodiode von Chou, Pei-Ting, Ying, Shang-Ping, Chen, Tzung-Te, Fu, Han-Kuei, Wang, Chien-Ping, Lee, Chih-Kung

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Evaluation of temperature distribution of LED module von Fu, Han-Kuei, Wang, Chien-Ping, Chiang, Hsin-Chien, Chen, Tzung-Te, Chen, Chiu-Ling, Chou, Pei-Ting

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The evaluation for the chromatic characteristics of LED module under electrical and thermal coupling analysis von Fu, Han Kuei, Peng, Yi Ping, Ying, Shang Pin, Chen, Tzung Te, Wang, Chien Ping, Chen, Chiu Ling, Chou, Pei Ting

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High-Voltage LEDs von Yeh, Wen-Yung, Yen, Hsi-Hsuan, Tai, Kuang-Yu, Chou, Pei-Ting

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Accelerated Degradation of High Power Light-Emitting Diode Resulted from Inhomogeneous Current Distribution von Yang, Shih Chun, Lin, Pang, Fu, Han Kuei, Lee, An Tse, Chen, Tzung Te, Wang, Chien Ping, Huang, Sheng Bang, Chou, Pei Ting

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High Voltage LEDs von Yeh, Wen-Yung, Yen, Hsi-Hsuan, Tai, Kuang-Yu, Chou, Pei-Ting

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Investigation of dynamic color deviation mechanisms of high power light-emitting diode: Reliability of High-Power LED Packaging and Assembly von FU, Han-Kuei, LIN, Chin-Wei, CHEN, Tzung-Te, CHEN, Chiu-Ling, CHOU, Pei-Ting, SUN, Chien-Jen

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Accelerated Degradation of High Power Light-Emitting Diode Resulted from Inhomogeneous Current Distribution von Yang, Shih Chun, Lin, Pang, Fu, Han Kuei, Lee, An Tse, Chen, Tzung Te, Wang, Chien Ping, Huang, Sheng Bang, Chou, Pei Ting

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Method of measuring thermal electric characteristics of semiconductor device von Chou Pei-Ting, Chen Tzung-Te, Wang Chien-Ping

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Testing method and testing system for semiconductor element von Chou Pei-Ting, Dai Chun-Fan, Fu Han-Kuei, Chen Tzung-Te, Wang Chien-Ping

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