Treffer 1 - 8 von 8 für Suche 'Chokhani, Arvind', Suchdauer: 0,50s Treffer weiter einschränken
  1. 1
    Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns

    Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns von Amodeo, Martin, Chokhani, Arvind, Swenton, Joseph M

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  2. 2
    Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip

    Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip von Chokhani, Arvind, Amodeo, Martin Thomas, Swenton, Joseph Michael

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  3. 3
    Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns

    Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns von Chokhani, Arvind, Amodeo, Martin Thomas, Swenton, Joseph Michael

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  4. 4
    Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects

    Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects von Chokhani, Arvind, Amodeo, Martin Thomas, Swenton, Joseph Michael

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  5. 5
    SDD ATPG using fault rules files, SDF and node slack for testing an IC chip

    SDD ATPG using fault rules files, SDF and node slack for testing an IC chip von Swenton, Joseph Micahel, Malagi, Santosh Subhaschandra, Chokhani, Arvind

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  6. 6
    Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chip

    Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chip von Malagi, Santosh Subhaschandra, Chokhani, Arvind, Swenton, Joseph Michael

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  7. 7
    Fault rules files for testing an IC chip

    Fault rules files for testing an IC chip von Malagi, Santosh Subhaschandra, Chokhani, Arvind, Swenton, Joseph Michael

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  8. 8
    Configurable architecture for smart pixel research

    Configurable architecture for smart pixel research von Raman, K.S., Chokhani, A., Vagheeswar, V.S., Beyette, F.R.


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