Treffer 1 - 9 von 9 für Suche 'Choi Samjong', Suchdauer: 0,39s Treffer weiter einschränken
  1. 1
    Capacitance–voltage characteristics of MOS capacitors with Ge nanocrystals embedded in ZrO 2 gate material

    Capacitance–voltage characteristics of MOS capacitors with Ge nanocrystals embedded in ZrO 2 gate material von Lee, Hye-Ryoung, Choi, Samjong, Cho, Kyoungah, Kim, Sangsig

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  2. 2
    Capacitance–voltage characterization of Ge-nanocrystal-embedded MOS capacitors with a capping Al 2 O 3 layer

    Capacitance–voltage characterization of Ge-nanocrystal-embedded MOS capacitors with a capping Al 2 O 3 layer von Choi, Samjong, Park, Byoungjun, Kim, Hyunsuk, Cho, Kyoungah, Kim, Sangsig


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  3. 3
    Capacitance–voltage characterization of Ge-nanocrystal-embedded MOS capacitors with a capping Al2O3 layer

    Capacitance–voltage characterization of Ge-nanocrystal-embedded MOS capacitors with a capping Al2O3 layer von Choi, Samjong, Park, Byoungjun, Kim, Hyunsuk, Cho, Kyoungah, Kim, Sangsig


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  4. 4
    MEMORY DEVICE

    MEMORY DEVICE von Choi, Samjong, Kim, Yehwan, Baek, Gayeong, Im, Hwon, Kim, Yeonsook, Kim, Euido, Kim, Cheongjun, Lee, Munkeun

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  5. 5
    THINNER COMPOSITION AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE BY USING THE SAME

    THINNER COMPOSITION AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE BY USING THE SAME von Choi, Samjong, Kim, Minki, Yoo, Seungryul, Kim, Jaehyun, Jung, Miyeon, Lee, Heekyung, Suh, Ahram, Kwon, Taehui, Kweon, Ohhwan, Shin, Sunggun, Kang, Yool, Kim, Dongjun

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  6. 6
    Semiconductor wafers including indications of crystal orientation and methods of forming the same

    Semiconductor wafers including indications of crystal orientation and methods of forming the same von Lee Dongjun, Koo Tae-Hyoung, Choi Samjong, Ko Yongsun

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  7. 7
    Semiconductor Wafers Including Indications of Crystal Orientation and Methods of Forming the Same

    Semiconductor Wafers Including Indications of Crystal Orientation and Methods of Forming the Same von KOO TAE-HYOUNG, KO YONGSUN, CHOI SAMJONG, LEE DONGJUN

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  8. 8
    Capacitance-voltage characteristics of MOS capacitors with Ge anaocrystals embedded in HfO2 gate material

    Capacitance-voltage characteristics of MOS capacitors with Ge anaocrystals embedded in HfO2 gate material von Hye-Ryoung Lee, Samjong Choi, Kyoungah Cho, Sangsig Kim

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  9. 9
    METHOD FOR MANUFACTURING WAFER AND WAFER MANUFACTURED BY THE METHOD

    METHOD FOR MANUFACTURING WAFER AND WAFER MANUFACTURED BY THE METHOD von KOO TAE-HYOUNG, KO YONGSUN, CHOI SAMJONG, LEE DONGJUN

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