Rational Ligand Design of Heteroleptic Iridium (III) Complexes toward Nearly Perfect Horizontal Dipole Orientation for Highly Efficient Red‐Emitting Phosphorescent Organic Light‐Em... von Kim, Sangdong, Kim, Jae‐Min, Choi, Jongwon, Sim, Myungsun, Koishikawa, Yasushi, Cho, Yong‐Suk, Kim, Sungjun, Kwak, Seung‐Yeon, Jeon, Aram, Kwon, Ohyun, Lee, Duck‐Hyung, Lee, Jun Yeob, Choi, Byungki

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Corrosion Characteristics of Ni-Cr and Co-Cr Alloy Used as a Dental Prosthesis and Its Adhesion to Porcelain von Kim, Kijung, Choi, Byungki, Oh, Doorok, Choi, Byung-Sang

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Ni-Cr과 Co-Cr 합금을 이용한 치과보철물의 부식 특성 및 도재 접합성 von 김기정, Ki Jung Kim, 최병기, Byung Ki Choi, 오두록, Doo Rok Oh, 최병상, Byung-sang Choi

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Apparatus for measuring the wrinkle on film von KYEONGLI RYU, PARK SANG WOOK, BYUNGKI CHOI, JAEKOO CHOI

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Measuring device of film droop quantity von KYEONGLI RYU, PARK SANG WOOK, BYUNGKI CHOI, JAEKOO CHOI

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Apparatus for measuring of film von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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System for measuring thickness and air permeability of film von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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METHOD FOR RECOGNIZING THE LOCATIONS OF ELECTRIC APPLIANCES von JO, Seongjin, KIM, Jongsun, CHOI, Byungki, OH, Minjin

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Apparatus of Measuring Straightness for Circle Pipe von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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Apparatus for inspecting fault of film von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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Lighting apparatus for inspecting reflective surface von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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Apparatus for measuring film edge von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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Device for detecting pin hole von KYEONGLI RYU, BYUNGKI CHOI, JAEKOO CHOI, JINDUK KIM

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METHOD FOR RECOGNIZING THE LOCATIONS OF ELECTRIC APPLIANCES von JO, SEONGJIN, KIM, JONGSUN, CHOI, BYUNGKI, OH, MINJIN

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STRUCTURE OF SHOES von JUNG, SUNCHUN, CHOI, BYUNGKI

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METHOD FOR RECOGNIZING THE LOCATIONS OF ELECTRIC APPLIANCES von JO SEONGJIN, CHOI BYUNGKI, OH MINJIN, KIM JONGSUN

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METHOD FOR RECOGNIZING THE LOCATIONS OF ELECTRIC APPLIANCES von JO, SEONGJIN, KIM, JONGSUN, CHOI, BYUNGKI, OH, MINJIN

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METHOD FOR RECOGNIZING THE LOCATIONS OF ELECTRIC APPLIANCES von JO, SEONGJIN, KIM, JONGSUN, CHOI, BYUNGKI, OH, MINJIN

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METHOD FOR RECOGNIZING THE LOCATIONS OF ELECTRIC APPLIANCES von JO, SEONGJIN, KIM, JONGSUN, CHOI, BYUNGKI, OH, MINJIN

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O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors von Ryu, Byungki, Noh, Hyeon-Kyun, Choi, Eun-Ae, Chang, K. J.

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