In situ control of oxygen vacancies in TiO2 by atomic layer deposition for resistive switching devices von Park, Sang-Joon, Lee, Jeong-Pyo, Jang, Jong Shik, Rhu, Hyun, Yu, Hyunung, You, Byung Youn, Kim, Chang Soo, Kim, Kyung Joong, Cho, Yong Jai, Baik, Sunggi, Lee, Woo

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A Review of Thin-film Thickness Measurements using Optical Methods von Park, Jungjae, Cho, Yong Jai, Chegal, Won, Lee, Joonyoung, Jang, Yoon-Soo, Jin, Jonghan

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Fourier analysis for rotating-element ellipsometers von YONG JAI CHO, CHEGAL, Won, HYUN MO CHO

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Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometers von Cho, Yong Jai, Chegal, Won

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Partially Spatial Coherent Thermal Emitter Based on an Epsilon-and-mu-near-zero Metamaterial von Kang, Byungsoo, Kim, Mingeon, Seo, Junyong, Choi, Jongin, Lee, Bong Jae, Min, Bumki, Le, Van Long, Cho, Yong Jai, Kim, Young Dong

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Change in electrical resistance and thermal stability of nitrogen incorporated Ge2Sb2Te5 films von Kim, YoungKuk, Hwang, Uk, Cho, Yong Jai, Park, H. M., Cho, M.-H., Cho, Pyeong-Seok, Lee, Jong-Heun

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Ultrasensitive detection of beta-amyloid 1–42 as a relevant biomarker for Alzheimer's disease in serum von Kim, Dong Hyung, Chegal, Won, Diware, Mangesh S., Choi, Wook, Lee, Nam Hee, Cho, Yong Jai, Cho, Hyun Mo

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Analysis of Guided-mode Resonant Grating Filters by Using a Rigorous Coupled-wave Method von Chegal, Won, Cho, Hyun Mo, Cho, Yong jai, Cheong, Hai Du

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High-speed 2D materials inspection using a microscopic dynamic spectroscopic imaging ellipsometer von Choi, Sukhyun, Woo, Chae Young, Hwang, Gukhyeon, Kheiryzadehkhanghah, Saeid, Choi, Inho, Cho, Yong Jai, Lee, Hyung Woo, Chegal, Won, Kim, Daesuk

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Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry von Jung, Juwon, Kim, Kibaek, Choi, Junho, Kim, NaGyeong, Chegal, Won, Cho, Yong Jai, Kim, Young-Joo

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ALD and MOCVD of Ga2O3 Thin Films Using the New Ga Precursor Dimethylgallium Isopropoxide, Me2GaOiPr von Lee, Heeju, Kim, Kunhee, Woo, Jeong-Jun, Jun, Doo-Jin, Park, Youngsoo, Kim, Yunsoo, Lee, Hong Won, Cho, Yong Jai, Cho, Hyun Mo

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Discharge physics and atomic layer etching in Ar/C4F6 inductively coupled plasmas with a radio frequency bias von Yoon, Min Young, Yeom, H. J., Kim, Jung Hyung, Chegal, Won, Cho, Yong Jai, Kwon, Deuk-Chul, Jeong, Jong-Ryul, Lee, Hyo-Chang

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Temperature-Dependent Plasmonic Response of Graphene Nanoresonators von Kim, Junhyung, Lee, Geonwoo, Menabde, Sergey G., Cho, Yong Jai, Rockstuhl, Carsten, Jang, Min Seok

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Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometers von Cho, Yong Jai, Chegal, Won, Lee, Jeong Pyo, Cho, Hyun Mo

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Normal-incidence type solution immersed silicon (SIS) biosensor for ultra-sensitive, label-free detection of cardiac troponin I von Kim, Dong Hyung, Chegal, Won, Cho, Yong Jai, Won O, Sang, Van Le, Long, Diware, Mangesh S., Paek, Se-Hwan, Kim, Young Dong, Cho, Hyun Mo

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Ultrasensitive, label-free detection of cardiac biomarkers with optical SIS sensor von Diware, Mangesh S., Cho, Hyun Mo, Chegal, Won, Cho, Yong Jai, Kim, Dong Soo, O, Sang Won, Kim, Kyeong-Suk, Paek, Se-Hwan

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Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometers von Cho, Yong Jai, Chegal, Won, Lee, Jeong Pyo, Cho, Hyun Mo

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Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry von Diware, Mangesh S., Park, Kyunam, Mun, Jihun, Park, Han Gyeol, Chegal, Won, Cho, Yong Jai, Cho, Hyun Mo, Park, Jusang, Kim, Hyungjun, Kang, Sang-Woo, Kim, Young Dong

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Calibration method for rotating-analyser-type spectral imaging ellipsometers von Chegal, Won, Cho, Yong Jai, Oh, Se Baek, Cho, Hyun Mo, Lee, Yun Woo, Kim, Soo Hyun

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Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept von Kim, Daesuk, Kim, Hyunsuk, Magnusson, Robert, Cho, Yong Jai, Chegal, Won, Cho, Hyun Mo

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