Impact of Dose Rate Effects and Damage Engineering on Device Performance von Shim, Kyuha, Hwang, Yeonsang, Lee, Yongseung, An, Jungsoo, Ryu, Seonho, Hahn, Seungho, Cho, Changjune, Hur, Namhae, Guo, Baonian, Liu, Jinning, Erokhin, Yuri

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