Evaluation of the Permeability of Agricultural Films to Various Fumigants von Qian, Yaorong, Kamel, Alaa, Stafford, Charles, Nguyen, Thuy, Chism, William J, Dawson, Jeffrey, Smith, Charles W

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Nonlinear regressions for analyzing growth stage on quinclorac interactions von Chism, W.J, Birch, J.B, Bingham, S.W

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Postemergence Control of Large Crabgrass (Digitaria sanguinalis) with Herbicides von Chism, William J., Bingham, S. Wayne

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Line and via voiding measurements in damascene copper lines using metal illumination von Borden, P.G., Li, J.P., Smith, S.R., Diebold, A.C., Chism, W.W.

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Herbicidal Activity of NAA (1-Naphthaleneacetic Acid) on Creeping Woodsorrel (Oxalis corniculata) in Ornamentals von Holt, Jodie S., Chism, William J.

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Smaller and bolder prey snails have higher survival in staged encounters with the sea star Pisaster giganteus von Foster, William C, Armstrong, Connor M, Chism, Gregory T, Pruitt, Jonathan N

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Uptake, translocation, and metabolism of quinclorac in two grass species von Chism, W.J. (Polytech Inst. State Univ., Blacksburg, VA), Bingham, S.W, Shaver, R.L

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Characterization and Production Metrology of Thin Transistor Gate Dielectric Films von Chism, William, Richter, Curt, Diebold, Alain C., Canterbury, Jesse

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Polarization modulation photoreflectance characterization of semiconductor quantum confined structures von Chism, William

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METHOD OF PHOTO-REFLECTANCE CHARACTERIZATION OF STRAIN AND ACTIVE DOPANT IN SEMICONDUCTOR STRUCTURES von CHISM, WILLIAM, W

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Optical Metrology for Ultra-thin Oxide and High-K Gate Dielectrics von Chism, William W, Diebold, Alain C, Price, James

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Optical interconnect needs new metrology von Chism, William

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METHOD OF PHOTO-REFLECTANCE CHARACTERIZATION OF STRAIN AND ACTIVE DOPANT IN SEMICONDUCTOR STRUCTURES von CHISM, WILLIAM, W

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METHOD OF DIRECT COULOMB EXPLOSION IN LASER ABLATION OF SEMICONDUCTOR STRUCTURES von CHISM, WILLIAM, W

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METHOD OF DIRECT COULOMB EXPLOSION IN LASER ABLATION OF SEMICONDUCTOR STRUCTURES von CHISM, WILLIAM, W

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Method of direct coulomb explosion in laser ablation of semiconductor structures von CHISM WILLIAM W

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In-line, Non-destructive Electrical Metrology of Nitrided Silicon Dioxide and High-k Gate Dielectric Layers von Hillard, Robert J, Hung, P Y, Chism, William, Ye, C Win, Howland, William H, Tan, Louison C, Kalnas, Christine E

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Method of photo-reflectance characterization of strain and active dopant in semiconductor structures von CHISM WILLIAM W

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Polarization modulation photoreflectance characterization of semiconductor electronic interfaces von CHISM WILLIAM W.II

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Systems and methods for high precision optical characterization of carrier transport properties in semiconductor manufacturing von Chism, II, William W

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