A Statistical Model of Erratic Behaviors in Flash Memory Arrays von Chimenton, A., Zambelli, C., Olivo, P.

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New Statistical Data and Modeling of Stress-Induced Leakage Current in 3D-NAND Floating Gate Non-Volatile Flash Memories von Chimenton, Andrea, Mielke, Neal R., Cho, Eunhwan, Kalastirsky, Ivan

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Flash Memory Reliability: an Improvement Against Erratic Erase Phenomena Using the Constant Charge Erasing Scheme von Chimenton, Andrea, Olivo, Piero

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A New Methodology for Two-Level Random-Telegraph-Noise Identification and Statistical Analysis von Chimenton, Andrea, Zambelli, Cristian, Olivo, Piero

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Erratic Bits in Flash Memories under Fowler-Nordheim Programming von Chimenton, Andrea, Pellati, Paolo, Olivo, Piero

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Statistical Modeling of Secondary Path During Erase Operation in Phase Change Memories von Zambelli, C., Chimenton, A., Olivo, P.

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A New Analytical Model of the Erasing Operation in Phase-Change Memories von Chimenton, A., Zambelli, C., Olivo, P.

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Fast Identification of Critical Electrical Disturbs in Nonvolatile Memories von Chimenton, A., Olivo, P.

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Impact of Pulsed Operation on Performance and Reliability of Flash Memories von Chimenton, A., Irrera, F., Olivo, P.

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Overerase phenomena: an insight into flash memory reliability von Chimenton, A., Pellati, P., Olivo, P.

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Erratic erase in flash memories - part I: basic experimental and statistical characterization von Chimenton, A, Olivo, P

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Radiation effects on floating-gate memory cells von Cellere, G., Pellati, P., Chimenton, A., Wyss, J., Modelli, A., Larcher, L., Paccagnella, A.

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Impact of high tunneling electric fields on erasing instabilities in NOR flash memories von Chimenton, A., Olivo, P.

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Reliability of erasing operation in NOR-Flash memories von Chimenton, Andrea, Olivo, Piero

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Nonvolatile Memory Partitioning Scheme for Technology-Based Performance-Reliability Tradeoff von Zambelli, Cristian, Bertozzi, Davide, Chimenton, Andrea, Olivo, Piero

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Reliability and performance characterization of a mems-based non-volatile switch von Gaddi, R, Schepens, C, Smith, C, Zambelli, C, Chimenton, A, Olivo, P

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Erratic erase in flash memories - Part II: Dependence on operating conditions von Chimenton, A, Olivo, P

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Constant charge erasing scheme for flash memories von Chimenton, A., Pellati, P., Olivo, P.

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Analysis of Edge Wordline Disturb in multimegabit charge trapping flash NAND arrays von Zambelli, C, Chimenton, A, Olivo, P

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Overerase phenomena: An insight into Flash memory reliability: Flash memory technology von CHIMENTON, Andrea, PELLATI, Paolo, OLIVO, Piero

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