Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress von Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun

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Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor von Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Lu, Wei-Siang, Jian, Fu-Yen, Tsai, Chih-Tsung, Huang, Sheng-Yao, Lin, Chia-Sheng

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Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors von Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Te-Chih, Chen, Yu-Te, Tsai, Ming-Yen, Chu, Ann-Kuo, Chung, Yi-Chen, Ting, Hung-Che, Chen, Chia-Yu

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Self-heating enhanced charge trapping effect for InGaZnO thin film transistor von Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Tsai, Ming-Yen, Chen, Yu-Te, Chung, Yi-Chen, Ting, Hung-Che, Chen, Chia-Yu

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Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te, JIAN, Fu-Yen, CHUNG, Yi-Chen, TING, Hung-Che, CHEN, Chia-Yu

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High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors von Tsai, Ming-Yen, Chang, Ting-Chang, Chu, Ann-Kuo, Hsieh, Tien-Yu, Chen, Te-Chih, Lin, Kun-Yao, Tsai, Wu-Wei, Chiang, Wen-Jen, Yan, Jing-Yi

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Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHUNG, Wang-Cheng, CHANG, Jung-Fang, CHEN, Yu-Te, LIAO, Po-Yung, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Chun, CHEN, Bo-Wei, CHU, Ann-Kuo, CHOU, Cheng-Hsu

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Systematic Investigations on Self-Heating-Effect-Induced Degradation Behavior in a-InGaZnO Thin-Film Transistors von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, CHEN, Yu-Te, TSAI, Ming-Yen, CHU, Ann-Kuo, CHUNG, Yi-Chen, TING, Hung-Che, CHEN, Chia-Yu

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Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors von Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Te-Chih, Chen, Yu-Chun, Chen, Yu-Te, Liao, Po-Yung, Chu, Ann-Kuo, Tsai, Wu-Wei, Chiang, Wen-Jen, Yan, Jing-Yi

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NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain von LIN, Chia-Sheng, CHEN, Ying-Chung, SHIH, Jou-Miao, CHANG, Ting-Chang, JIAN, Fu-Yen, HSU, Wei-Che, KUO, Yuan-Jui, DAI, Chih-Hao, CHEN, Te-Chih, LO, Wen-Hung, HSIEH, Tien-Yu

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Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor von Tsai, Ming-Yen, Chang, Ting-Chang, Chu, Ann-Kuo, Chen, Te-Chih, Hsieh, Tien-Yu, Lin, Kun-Yao, Tsai, Wu-Wei, Chiang, Wen-Jen, Yan, Jing-Yi

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Mechanism of a-IGZO TFT device deterioration-illumination light wavelength and substrate temperature effects von Chen, Te-Chih, Kuo, Yue, Chang, Ting-Chang, Chen, Min-Chen, Chen, Hua-Mao

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Effect of N2O plasma treatment on the improvement of instability under light illumination for InGaZnO thin-film transistors von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, LU, Wei-Hsiang, CHEN, Shih-Cheng, JIAN, Fu-Yen, LIN, Chia-Sheng

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Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHUNG, Wang-Cheng, CHANG, Jung-Fang, CHEN, Yu-Te, LIAO, Po-Yung, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Chun, CHEN, Bo-Wei, CHU, Ann-Kuo, CHOU, Cheng-Hsu

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Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te, JIAN, Fu-Yen, LIN, Chia-Sheng, TSAI, Wu-Wei, CHIANG, Wen-Jen, YAN, Jing-Yi

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Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition von Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Tsai, Chih-Tsung, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun

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Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress von Lin, Chia-Sheng, Chen, Ying-Chung, Chang, Ting-Chang, Jian, Fu-Yen, Li, Hung-Wei, Chen, Yi-Chuan, Chen, Te-Chih, Tai, Ya-Hsiang

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Retraction notice to “Investigating Degradation Behavior of InGaZnO Thin-Film Transistors induced by Charge-Trapping Effect under DC and AC Gate-Bias Stress” [Thin Solid Films, 528... von Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Te-Chih, Tsai, Ming-Yen, Chen, Yu-Te

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Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs von LIN, Chia-Sheng, CHEN, Ying-Chung, CHANG, Ting-Chang, CHEN, Shih-Ching, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Te-Chih, WENG, Chi-Feng, JIN LU, HSU, Wei-Che

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Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device von CHEN, Te-Chih, CHANG, Ting-Chang, JIAN, Fu-Yen, CHEN, Shih-Ching, LIN, Chia-Sheng, LEE, Ming-Hsien, CHEN, Jim-Shone, SHIH, Ching-Chieh

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