High-speed AFM for scanning the architecture of living cells von Li, Jing, Deng, Zhifeng, Chen, Daixie, Ao, Zhuo, Sun, Quanmei, Feng, Jiantao, Yin, Bohua, Han, Li, Han, Dong

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CsPbX3 Based X‐Ray Detectors von Shi, Shenghuan, Yao, Huanhuan, Chen, Daixie, Li, Zhizai, Zhuang, Xu, Wang, Qian

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CsPbX 3 Based X‐Ray Detectors von Shi, Shenghuan, Yao, Huanhuan, Chen, Daixie, Li, Zhizai, Xu, Zhuang, Wang, Qian

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High-speed AFM for scanning the architecture of living cellsElectronic supplementary information (ESI) available: Movie of the real-time change of inner surface within fresh blood... von Li, Jing, Deng, Zhifeng, Chen, Daixie, Ao, Zhuo, Sun, Quanmei, Feng, Jiantao, Yin, Bohua, Han, Li, Han, Dong

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Active Disturbance Rejection Control Design for Fast AFM von Li, Han, Chen, Dai Xie, Liu, Jun Biao, Yin, Bo Hua, Wu, Li Qiang, Li, Wen Ping

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A Traceable Metrological Method with Nanometer Scale Resolution for Micro-Structure von Yin, Bo Hua, Xue, Hong, Lin, Yun Sheng, Chen, Dai Xie, Han, Li, Li, Wei, Gao, Si Tian

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Micron and Nanometer Measuring Methods Based on Metrological Scanning Electron Microscope von Xia, Rui, Chu, Ming Zhang, Li, Han, Chen, Dai Xie, Wen, Liang Dong, Xue, Hong, Yin, Bo Hua

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AFM Fast Tip Approach Based on Fiber Optic Sensor von Lin, Yun Sheng, Li, Han, Chen, Dai Xie, Chu, Ming Zhang, Yin, Bo Hua, Ju, Yu

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Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging von Chen, Dai Xie, Lin, Yun Sheng, Yin, Bo Hua, Gao, Ying Ying, Li, Han, Han, Dong

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A Novel Atomic Force Microscope Control System Based on PC104 and DSP Embedded System von Yin, Bohua, Chen, Daixie, Lin, Yunsheng, Chu, Mingzhang, Han, Li

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Scanning parameters optimization for digital PI controller von Daixie Chen, Min Li, Yunsheng Lin, Bohua Yin, Li Han

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Oil field safety protection uses special vehicle von CHI JIANFENG, XIAO CHANG, CHEN DAIXIE, GU MING

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Probe inserting device of scanning probe microscope and method thereof von YIN BOHUA, LIN YUNSHENG, HAN LI, GAO YINGYING, CHEN DAIXIE, CHU MINGZHANG

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Micro-nano scale dynamic coupling vibration single-point tracking measurement method von YIN BOHUA, LIN YUNSHENG, LIU JUNBIAO, HAN LI, CHEN DAIXIE, CHU MINGZHANG

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Flexible hinge displacement platform coupled vibration initiative back-off system von YIN BOHUA, LIN YUNSHENG, HAN LI, CHEN DAIXIE

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SPM high resolution graphics data processing method von LIN YUNSHENG, HAN LI, CHEN DAIXIE

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Probe inserting device of scanning probe microscope and method thereof von YIN BOHUA, LIN YUNSHENG, HAN LI, GAO YINGYING, CHEN DAIXIE, CHU MINGZHANG

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Needle inserting method for atomic force microscope von YIN BOHUA, LIN YUNSHENG, HAN LI, GAO YINGYING, CHEN DAIXIE, CHU MINGZHANG

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Flexible hinge displacement platform coupled vibration initiative back-off system von YIN BOHUA, LIN YUNSHENG, HAN LI, CHEN DAIXIE

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SPM high resolution graphics data processing method von LIN YUNSHENG, HAN LI, CHEN DAIXIE

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