Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers von Cheary, R W, Coelho, A A, Cline, J P

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A fundamental parameters approach to X-ray line-profile fitting von Cheary, R. W., Coelho, A.

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Axial Divergence in a Conventional X-ray Powder Diffractometer. I. Theoretical Foundations von Cheary, R. W., Coelho, A. A.

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Axial Divergence in a Conventional X-ray Powder Diffractometer. II. Realization and Evaluation in a Fundamental-Parameter Profile Fitting Procedure von Cheary, R. W., Coelho, A. A.

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X-ray reflectivity study of radio frequency sputtered silicon oxide on silicon von Solina, D.M., Cheary, R.W., Kalceff, W., McCredie, G.

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Fabrication and characterisation of ultra-thin tungsten–carbon (W/C) and platinum–carbon (Pt/C) multilayers for X-ray mirrors von Gan, B.K., Latella, B.A., Cheary, R.W.

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Quantitative phase analysis by X-ray diffraction of martensite and austenite in strongly oriented orthodontic stainless steel wires von CHEARY, R. W, MA-SORRELL, Y

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X-ray diffraction line broadening from thermally deposited gold films von Cheary, R. W., Dooryhee, E., Lynch, P., Armstrong, N., Dligatch, S.

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The fabrication of stable platinum–silicon oxide multilayers for X-ray mirrors von Solina, D.M, Cheary, R.W, Swift, P.D, McCredie, G

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Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy von Solina, D.M, Cheary, R.W, Swift, P.D, Dligatch, S, McCredie, G.M, Gong, B, Lynch, P

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Analysis and Structural Determination of Nd-Substituted Zirconolite-4M von Coelho, A.A., Cheary, R.W., Smith, K.L.

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Synthesizing and fitting linear position-sensitive detector step-scanned line profiles von Cheary, R. W., Coelho, A.

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Investigation of the interfacial structure of ultra-thin platinum film deposited by cathodic–arc von Swift, P.D., Solina, D.M., Cheary, R.W., McCredie, G.M.

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An in situ method for the study of strain broadening using synchrotron X-ray diffraction von Tang, C. C., Lynch, P. A., Cheary, R. W., Clark, S. M.

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A site occupancy analysis of zirconolite CaZrxTi3−xO7 von Cheary, R W, Coelho, A A

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An analysis of the structural characteristics of hollandite compounds von Cheary, R. W.

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Caesium substitution in the titanate hollandites BaxCsy(Ti3+y+2xTi4+8−2x-y)O16 from 5 to 400 K von Cheary, R. W.

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An analysis of Ag/Al2O3 angular selective films by X-ray reflectivity von Dligatch, S., Cheary, R.W., Smith, G.B.

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A structural analysis of potassium, rubidium and caesium substitution in barium hollandite von Cheary, R. W.

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Designing a new physics laboratory programme for first-year engineering students von Kirkup, L, Johnson, S, Hazel, E, Cheary, R W, Green, D C, Swift, P, Holliday, W

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