Online Fault Tolerance for FPGA Logic Blocks von Emmert, J.M., Stroud, C.E., Abramovici, M.

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Selective Spectrum Analysis for Analog Measurements von Jie Qin, Cali, J. D., Dutton, B. F., Starr, G. J., Dai, F. F., Stroud, C. E.

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Online BIST and BIST-based diagnosis of FPGA logic blocks von Abramovici, M., Stroud, C.E., Emmert, J.M.

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FPGA-Based Analog Functional Measurements for Adaptive Control in Mixed-Signal Systems von Jie Qin, Stroud, C.E., Dai, F.F.

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On Built-In Self-Test for Adders von Pulukuri, Mary D., Stroud, Charles E.

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PSIM: A processor SIMulator for basic computer architecture and operation education von Lusco, Michael Alexander, Stroud, Charles E

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Soft-core embedded processor-based Built-In Self-Test of FPGAs: A case study von Dutton, Bradley F, Stroud, Charles E

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Built-In Self-Test of configurable logic blocks in Virtex-5 FPGAs von Dutton, B.F., Stroud, C.E.

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On Built-In Self-Test for multipliers von Pulukuri, Mary D, Starr, George J, Stroud, Charles E

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BIST-Based Delay-Fault Testing in FPGAs von Abramovici, Miron, Stroud, Charles E

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On system-level use of BIST for programmable Input/Output buffers in FPGAs von Dutton, Bradley F, Lerner, Lee W, Vemula, Sudheer, Stroud, Charles E

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VLSI Test Principles and Architectures von Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Nur A. Touba, Erik H. Volkerink, Duncan Walker, Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Shianling Wu

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Built-In Self-Test of programmable input/output tiles in Virtex-5 FPGAs von Dutton, B.F., Stroud, C.E.

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Guest Editorial von Dai, Fa Foster, Stroud, Charles E., Zhang, Jing Bing

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Guest Editorial von Dai, Fa Foster, Stroud, Charles E., Zhang, Jing Bing

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An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults von Smith, Jack, Xia, Tian, Stroud, Charles

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BIST-based test and diagnosis of FPGA logic blocks von Abramovici, M., Stroud, C.E.

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Automatic linearity and frequency response tests with built-in pattern generator and analyzer von Fa Dai, F., Stroud, C., Dayu Yang

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Soft Core Embedded Processor Based Built-In Self-Test of FPGAs von Dutton, B.F., Stroud, C.E.

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A New Method for Testing Re-Programmable PLAs von Stroud, Charles E, Bailey, James R, Emmert, Johan R

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