An Accurate Two-Port De-Embedding Technique for RF/Millimeter-Wave Noise Characterization and Modeling of Deep Submicrometer Transistors von Xi Sung Loo, Kiat Seng Yeo, Chew, Kok Wai J, Chan, Lye Hock Kelvin, Shih Ni Ong, Manh Anh Do, Chirn Chye Boon

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High-Frequency Noise Modeling of MOSFETs for Ultra Low-Voltage RF Applications von Chan, Lye Hock Kelvin, Kiat Seng Yeo, Chew, Kok Wai Johnny, Shih Ni Ong

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Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs von Shih Ni Ong, Kiat Seng Yeo, Chew, Kok Wai Johnny, Chan, Lye Hock Kelvin

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