Correlation of Optical, Structural, and Compositional Properties with V‑Pit Distribution in InGaN/GaN Multiquantum Wells von Zoellner, Marvin Hartwig, Chahine, Gilbert André, Lahourcade, Lise, Mounir, Christian, Manganelli, Costanza Lucia, Schülli, Tobias Urs, Schwarz, Ulrich Theodor, Zeisel, Roland, Schroeder, Thomas

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Advanced Non-Destructive in Situ Characterization of Metals with the French Collaborating Research Group D2AM/BM02 Beamline at the European Synchrotron Radiation Facility von Chahine, Gilbert André, Blanc, Nils, Arnaud, Stephan, De Geuser, Frédéric, Guinebretière, René, Boudet, Nathalie

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Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping von Chahine, Gilbert André, Richard, Marie-Ingrid, Homs-Regojo, Roberto Arturo, Tran-Caliste, Thu Nhi, Carbone, Dina, Jaques, Vincent Louis Robert, Grifone, Raphael, Boesecke, Peter, Katzer, Jens, Costina, Ioan, Djazouli, Hamid, Schroeder, Thomas, Schülli, Tobias Urs

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A study of the strain distribution by scanning X‐ray diffraction on GaP/Si for III–V monolithic integration on silicon von Zhou, Ang, Ping Wang, Yan, Cornet, Charles, Léger, Yoan, Pédesseau, Laurent, Favre-Nicolin, Vincent, Chahine, Gilbert André, Schülli, Tobias Urs, Eymery, Joël, Bahri, Mounib, Largeau, Ludovic, Patriarche, Gilles, Durand, Olivier, Létoublon, Antoine

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Precise control of J(eff)=1/2 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness von Geprags, Stephan, Skovdal, Björn Erik, Scheufele, Monika, Opel, Matthias, Wermeille, Didier, Thompson, Paul, Bombardi, Alessandro, Simonet, Virginie, Grenier, Stephane, Lejay, Pascal, Chahine, Gilbert Andre, Quintero-Castro, Diana Lucia, Gross, Rudolf, Mannix, Danny

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Precise control of Jeff = 1/2 magnetic properties in Sr2 IrO4 epitaxial thin films by variation of strain and thin film thickness von Geprägs, Stephan, Skovdal, Björn Erik, Scheufele, Monika, Opel, Matthias, Wermeille, Didier, Thompson, Paul, Bombardi, Alessandro, Simonet, Virginie, Grenier, Stéphane, Lejay, Pascal, Chahine, Gilbert Andre, Quintero-Castro, Diana Lucia, Gross, Rudolf, Mannix, Danny

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Precise control of J eff = 1 2 magnetic properties in Sr 2 IrO 4 epitaxial thin films by variation of strain and thin film thickness von Geprägs, Stephan, Skovdal, Björn Erik, Scheufele, Monika, Opel, Matthias, Wermeille, Didier, Thompson, Paul, Bombardi, Alessandro, Simonet, Virginie, Grenier, Stéphane, Lejay, Pascal, Chahine, Gilbert Andre, Quintero-Castro, Diana Lucia, Gross, Rudolf, Mannix, Danny

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Precise control of $J_\mathrm{eff}=1/2$ magnetic properties in Sr$_2$IrO$_4$ epitaxial thin films by variation of strain and thin film thickness von Geprägs, Stephan, Skovdal, Björn Erik, Scheufele, Monika, Opel, Matthias, Wermeille, Didier, Thompson, Paul, Bombardi, Alessandro, Simonet, Virginie, Grenier, Stéphane, Lejay, Pascal, Chahine, Gilbert Andre, Castro, Diana Quintero, Gross, Rudolf, Mannix, Dan

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Precise control of \(J_\mathrm{eff}=1/2\) magnetic properties in Sr\(_2\)IrO\(_4\) epitaxial thin films by variation of strain and thin film thickness von Geprägs, Stephan, Skovdal, Björn Erik, Scheufele, Monika, Opel, Matthias, Wermeille, Didier, Thompson, Paul, Bombardi, Alessandro, Simonet, Virginie, Grenier, Stéphane, Lejay, Pascal, Chahine, Gilbert Andre, Diana Quintero Castro, Gross, Rudolf, Mannix, Dan

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Advanced Non-Destructive in Situ Characterization of Metals with the French Collaborating Research Group D2AM/BM02 Beamline at the European Synchrotron Radiation Facility von Chahine, Gilbert André, Blanc, Nils, Arnaud, Stephan, De Geuser, Frédéric, Guinebretière, René, Boudet, Nathalie

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