Study of silicon carbide for X-ray detection and spectroscopy von Bertuccio, G., Casiraghi, R.

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Possibility of Subelectron Noise With Room-Temperature Silicon Carbide Pixel Detectors von Bertuccio, G., Caccia, S., Casiraghi, R., Lanzieri, C.

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Epitaxial silicon carbide for X-ray detection von Bertuccio, G., Casiraghi, R., Nava, F.

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Analyzing integrated circuits at work with a picosecond time-gated imager von Comelli, D, D'Andrea, C, Valentini, G, Cubeddu, R, Casiraghi, R, Cantarelli, D

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Low-noise silicon carbide X-ray sensor with wide operating temperature range von Bertuccio, G., Casiraghi, R., Cetronio, A., Lanzieri, C., Nava, F.

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Noise analysis of gallium arsenide pixel X-ray detectors coupled to ultra-low noise electronics von Bertuccio, G., Casiraghi, R., Maiocchi, D., Owens, A., Bavdaz, M., Peacock, A., Andersson, H., Nenonen, S.

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A test structure for contact and via failure analysis in deep-submicrometer CMOS technologies von Cabrini, A., Cantarelli, D., Cappelletti, P., Casiraghi, R., Maurelli, A., Pasotti, M., Rolandi, P.L., Torelli, G.

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Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors von Binetti, Simona, Pizzini, Sergio, Caccia, S., Casiraghi, R., Rigutti, L., Cavallini, Anna, Nava, Filippo, Le Donne, Alessia, Verzellesi, G., Bertuccio, Giuseppe, Lanzieri, Claudio, Castaldini, Antonio

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Study of Ion Induced Damage in 4H-SiC von Jaksic, M., Oliveira, P., Bianco, Stefano, Casiraghi, R., Manfredotti, Claudio, Fizzotti, F., Bertuccio, Giuseppe, Lo Giudice, A., Vittone, E.

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SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range von Casiraghi, R., Maiocchi, D., Nava, Filippo, Bertuccio, Giuseppe, Cetronio, Antonio, Lanzieri, Claudio, Gatti, E., Canali, C.

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A new generation of X-ray detectors based on silicon carbide von Bertuccio, Giuseppe, Casiraghi, Roberto, Cetronio, Antonio, Lanzieri, Claudio, Nava, Filippo

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Novel test strategy for statistical evaluation of defect density and reliability of contacts and vias von Cabrini, A., Torelli, G., Cantarelli, D., Cappelletti, P., Casiraghi, R., Iezzi, D., Lombardi, C., Maurelli, A., Pasotti, M., Rolandi, P.L.

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Low-noise silicon carbide X-ray sensor with wide operating temperature range von Bertuccio, G, Casiraghi, R, Cetronio, A, Lanzieri, C, Nava, F

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A failure analysis test structure for deep sub-micron CMOS copper interconnect technologies von Cabrini, A., Cantarelli, D., Cappelletti, P., Casiraghi, R., Iezzi, D., Maurelli, A., Pasotti, M., Rolandi, P.L., Torelli, G.

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Strong Light-Matter Interactions in Heterostructures of Atomically Thin Films von Britnell, L., Ribeiro, R. M., Eckmann, A., Jalil, R., Belle, B. D., Mishchenko, A., Kim, Y.-J., Gorbachev, R. V., Georgiou, T., Morozov, S. V., Grigorenko, A. N., Geim, A. K., Casiraghi, C., Neto, A. H. Castro, Novoselov, K. S.

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NIR spectroscopy for the optimization of postharvest apple management von Giovanelli, G., Sinelli, N., Beghi, R., Guidetti, R., Casiraghi, E.

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Verkehrs- und Bauphasenmanagement beim Ausbau A2, Luzern-Süd von Burkhart, P, Casiraghi, R, Meyer, W

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Commensurate–incommensurate transition in graphene on hexagonal boron nitride von Woods, C. R., Britnell, L., Eckmann, A., Ma, R. S., Lu, J. C., Guo, H. M., Lin, X., Yu, G. L., Cao, Y., Gorbachev, R. V., Kretinin, A. V., Park, J., Ponomarenko, L. A., Katsnelson, M. I., Gornostyrev, Yu. N., Watanabe, K., Taniguchi, T., Casiraghi, C., Gao, H-J., Geim, A. K., Novoselov, K. S.

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Enhancement of the Dzyaloshinskii-Moriya interaction and domain wall velocity through interface intermixing in Ta/CoFeB/MgO von Diez, L. Herrera, Voto, M., Casiraghi, A., Belmeguenai, M., Roussigné, Y., Durin, G., Lamperti, A., Mantovan, R., Sluka, V., Jeudy, V., Liu, Y. T., Stashkevich, A., Chérif, S. M., Langer, J., Ocker, B., Lopez-Diaz, L., Ravelosona, D.

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Inkjet printed 2D-crystal based strain gauges on paper von Casiraghi, C., Macucci, M., Parvez, K., Worsley, R., Shin, Y., Bronte, F., Borri, C., Paggi, M., Fiori, G.

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