The impact of multiple failure modes on estimating product field reliability von Carulli, J.M., Anderson, T.J.

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Quality improvement and cost reduction using statistical outlier methods von Nahar, A., Butler, K.M., Carulli, J.M., Weinberger, C.

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Modeling Test Escape Rate as a Function of Multiple Coverages von Butler, K.M., Carulli, J.M., Saxena, J.

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Multidimensional Test Escape Rate Modeling von Butler, K.M., Carulli, J.M., Saxena, J., Nahar, A., Daasch, W.R.

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Test connections - tying application to process von Carulli, J.M., Anderson, T.J.

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Modeling & Monitoring of Product DPPM with Multiple Fail Modes von Anderson, T.J., Carulli, J.M.

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Successful Development and Implementation of Statistical Outlier Techniques on 90nm and 65nm Process Driver Devices von Butler, K.M., Subramaniam, S., Nahar, A., Carulli, J.M., Anderson, T.J., Daasch, W.R.

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Resilience to Alzheimer’s Disease: Unraveling the Molecular Mechanisms From Post‐Mortem Tissue von de Vries, Luuk E, Carulli, Daniela, Jongejan, Aldo, Moerland, Perry D, Rozemuller, Annemieke J.M., Huitinga, Inge, Swaab, Dick F, Verhaagen, Joost

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