Bismuth volatility effects on the perfection of SrBi2Nb2O9 and SrBi2Ta2O9 films von Zurbuchen, M. A., Lettieri, J., Fulk, S. J., Jia, Y., Carim, A. H., Schlom, D. G., Streiffer, S. K.

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Morphology, structure, and nucleation of out-of-phase boundaries (OPBs) in epitaxial films of layered oxides von Zurbuchen, M.A., Tian, W., Pan, X.Q., Fong, D., Streiffer, S.K., Hawley, M.E., Lettieri, J., Jia, Y., Asayama, G., Fulk, S.J., Comstock, D.J., Knapp, S., Carim, A.H., Schlom, D.G.

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Selective dissolution below the critical potential and back alloying in copper-gold alloy von ATEYA, B. G, GEH, G, CARIM, A. H, PICKERING, H. W

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Microstructure of Solution-Processed Lead Zirconate Titanate (PZT) Thin Films von Carim, Altaf H., Tuttle, Bruce A., Doughty, Daniel H., Martinez, Sheri L.

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Brazing of alumina with Ti4CU2O and Ti3CU3O interlayers von CARIM, A. H, MOHR, C. H

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Crystal Structure and Compressibility of Ba4Ru3O10 von Carim, A.H., Dera, P., Finger, L.W., Mysen, B., Prewitt, C.T., Schlom, D.G.

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Symmetry and crystal structure of Ti3SiC2 von Arunajatesan, Sowmya, Carim, A.H.

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Grain Boundaries in Titania-Doped α-Alumina with Anisotropic Microstructure von Kebbede, Anteneh, Messing, Gary L., Carim, Altaf H.

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Segregation of Si and Ti in α-alumina von Kebbede, Anteneh, Carim, Altaf H

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A reassessment of electron escape depths in silicon and thermally grown silicon dioxide thin films von Hochella, M.F., Carim, A.H.

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Synthesis of Titanium Silicon Carbide von Arunajatesan, Sowmya, Carim, Altaf H.

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Bicrystalline Silicon Nanowires von Carim, A. H., Lew, K.-K., Redwing, J. M.

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The evolution of Si/SiO2 interface roughness von CARIM, A. H, SINCLAIR, R

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Ternary compounds and phase equilibria in Ti-Ge-C and Ti-Ge-B von KEPHART, J. S, CARIM, A. H

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Determination of attenuation lengths and electron escape depths in silicon nitride thin films von HONGGANG HU, CARIM, A. H

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Conversion of Diaspore to Corundum: A New α-Alumina Transformation Sequence von Carim, Altaf H., Rohrer, Gregory S., Dando, Neal R., Tzeng, Shih-Ying, Rohrer, Cathy L., Perrotta, Anthony J.

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Influence of process variations on microstructure in doped sol–gel derived α-alumina von Kebbede, Anteneh, Carim, Altaf H

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SiC/Al4C3 interfaces in aluminium-silicon carbide composites von CARIM, A. H

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High-Resolution Electron Microscopy and Scanning Tunneling Microscopy of Native Oxides on Silicon von Carim, A. H., Dovek, M. M., Quate, C. F., Sinclair, R., Vorst, C.

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Strength and Microstructure of Brazed Alumina-Silicon Carbide Ceramic-Matrix Composites von Zurbuchen, Mark A., Carim, Altaf H.

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