On the origins of fatigue strength in crystalline metallic materials von Stinville, J. C., Charpagne, M. A., Cervellon, A., Hemery, S., Wang, F., Callahan, P. G., Valle, V., Pollock, T. M.

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Microstructural statistics for fatigue crack initiation in polycrystalline nickel-base superalloys von Stinville, J. C., Lenthe, W. C., Echlin, M. P., Callahan, P. G., Texier, D., Pollock, T. M.

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Towards a quantitative comparison between experimental and synthetic grain structures von Callahan, P.G., Groeber, M., De Graef, M.

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Rejuvenation of Directionally Solidified and Single-Crystal Nickel-Base Superalloys von Rettberg, L. H., Callahan, P. G., Goodlet, B. R., Pollock, T. M.

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Nondestructive evaluation of 3D microstructure evolution in strontium titanate von Trenkle, A., Syha, M., Rheinheimer, W., Callahan, P.G., Nguyen, L., Ludwig, W., Lenthe, W., Echlin, M. P., Pollock, T. M., Weygand, D., De Graef, M., Hoffmann, M. J., Gumbsch, P.

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Time-Resolved Digital Image Correlation in the Scanning Electron Microscope for Analysis of Time-Dependent Mechanisms von Stinville, J.C., Francis, T., Polonsky, A.T., Torbet, C.J., Charpagne, M.A., Chen, Z., Balbus, G.H., Bourdin, F., Valle, V., Callahan, P.G., Echlin, M.P., Pollock, T.M.

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Measurement of Strain Localization Resulting from Monotonic and Cyclic Loading at 650 ∘C in Nickel Base Superalloys von Stinville, J. C., Echlin, M. P., Callahan, P. G., Miller, V. M., Texier, D., Bridier, F., Bocher, P., Pollock, T. M.

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Determination of sample surface topography using electron back-scatter diffraction patterns von Chapman, M., Callahan, P.G., De Graef, M.

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Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy von Wielewski, E, Menasche, D B, Callahan, P G, Suter, R M

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Automated Prediction of Pseudo-Symmetry Issues in EBSD von Callahan, P. G., Singh, Saransh, Echlin, M., Stinville, J. C., Pollock, T. M., De Graef, Marc

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A quantitative description of the morphological aspects of materials structures suitable for quantitative comparisons of 3D microstructures von Callahan, P G, Simmons, J P, De Graef, M

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Limits to mobility in InAs quantum wells with nearly lattice-matched barriers von Shojaei, B., Drachmann, A. C. C., Pendharkar, M., Pennachio, D. J., Echlin, M. P., Callahan, P. G., Kraemer, S., Pollock, T. M., Marcus, C. M., Palmstrøm, C. J.

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Precipitate shape fitting and reconstruction by means of 3D Zernike functions von Callahan, P G, De Graef, M

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Direct measurements of slip irreversibility in a nickel-based superalloy using high resolution digital image correlation von Stinville, J.C., Callahan, P.G., Charpagne, M.A., Echlin, M.P., Valle, V., Pollock, T.M.

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Measurements of plastic localization by heaviside-digital image correlation von Bourdin, F., Stinville, J.C., Echlin, M.P., Callahan, P.G., Lenthe, W.C., Torbet, C.J., Texier, D., Bridier, F., Cormier, J., Villechaise, P., Pollock, T.M., Valle, V.

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Insights into Plastic Localization by Crystallographic Slip from Emerging Experimental and Numerical Approaches von Stinville, J.C, Charpagne, M.A, Maaß, R, Proudhon, H, Ludwig, W, Callahan, P.G, Wang, F, Beyerlein, I.J, Echlin, M.P, Pollock, T.M

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Automated and quantitative analysis of plastic strain localization via multi-modal data recombination von Charpagne, M.A., Stinville, J.C., Callahan, P.G., Texier, D., Chen, Z., Villechaise, P., Valle, V., Pollock, T.M.

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Observation of bulk plasticity in a polycrystalline titanium alloy by diffraction contrast tomography and topotomography von Stinville, J.C., Ludwig, W., Callahan, P.G., Echlin, M.P., Valle, V., Pollock, T.M., Proudhon, H.

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Measurement of elastic and rotation fields during irreversible deformation using Heaviside-digital image correlation von Stinville, J.C., Charpagne, M.A., Bourdin, F., Callahan, P.G., Chen, Z., Echlin, M.P., Texier, D., Cormier, J., Villechaise, P., Pollock, T.M., Valle, V.

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Recombination activity of threading dislocations in GaInP influenced by growth temperature von Mukherjee, K., Reilly, C. H., Callahan, P. G., Seward, G. G. E.

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