Finite-key analysis for practical implementations of quantum key distribution von Cai, Raymond Y Q, Scarani, Valerio

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Finite-key analysis for practical implementations of quantum key distribution von Scarani, Raymond Y Q Cai and Valerio

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Finite-key analysis for practical implementations of quantum key distribution von Cai, Raymond Y Q, Scarani, Valerio

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Biological insights from 108 schizophrenia-associated genetic loci von Neale, Benjamin M, Pers, Tune H, Agartz, Ingrid, Agerbo, Esben, Amin, Farooq, Bergen, Sarah E, Bigdeli, Tim B, Buckner, Randy L, Cai, Guiqing, Catts, Stanley V, Chan, Raymond C. K, Chen, Eric Y. H, Cheng, Wei, Cheung, Eric F. C, Ann Chong, Siow, Robert Cloninger, C, Cohen, Nadine, Crowley, James J, Davidson, Michael, Davis, Kenneth L, Del Favero, Jurgen, Demontis, Ditte, Dinan, Timothy, Djurovic, Srdjan, Drapeau, Elodie, Eriksson, Johan, Escott-Price, Valentina, Friedl, Marion, Fromer, Menachem, Genovese, Giulio, Georgieva, Lyudmila, Giusti-Rodriguez, Paola, Gopal, Srihari, Gratten, Jacob, Hammer, Christian, Hofman, Andrea, Hougaard, David M, Julia, Antonio, Klovins, Janis, Ausrele Kucinskiene, Zita, Hong Lee, S, Lerer, Bernard, Limborska, Svetlana, Lubinski, Jan, Macek Jr, Milan, Magnusson, Patrik K. E, Mattheisen, Manuel, McDonald, Colm, Michie, Patricia T, Milanova, Vihra, Mokrab, Younes, Muller-Myhsok, Bertram, Nenadic, Igor, Nordin, Annelie, Van Os, Jim, Endophenotypes International Consortium, Psychosis, Parkhomenko, Elena, Pejovic-Milovancevic, Milica, Pimm, Jonathan, Price, Alkes, Purcell, Shaun M, Quested, Digby, Rasmussen, Henrik B, Roffman, Joshua L, Schubert, Christian R, Schwab, Sibylle G, Scott, Rodney J, Seidman, Larry J, Silverman, Jeremy M, Smoller, Jordan W, Steinberg, Stacy, Strengman, Eric, Strohmaier, Jana, Svrakic, Dragan M, Soderman, Erik, Thirumalai, Srinivas, Toncheva, Draga, Tosato, Sarah, Veijola, Juha, Walsh, Dermot, Weiser, Mark, Wolen, Aaron R, Zheng, Xuebin, Wray, Naomi R, Visscher, Peter M, Trust Case-Control Consortium, Wellcome, Andreassen, Ole A, Blackwood, Douglas H. R, Esko, Tonu, Gill, Michael, Jablensky, Assen V, McCarroll, Steven A, Mowry, Bryan J, Owen, Michael J, Pato, Carlos N, Posthuma, Danielle, Rujescu, Dan, Sham, Pak C, Sklar, Pamela, St Clair, David

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Gene expression imputation across multiple brain regions provides insights into schizophrenia risk von Huckins, Laura M., Dobbyn, Amanda, Ruderfer, Douglas M., Hoffman, Gabriel, Wang, Weiqing, Pardiñas, Antonio F., Rajagopal, Veera M., Als, Thomas D., T. Nguyen, Hoang, Girdhar, Kiran, Boocock, James, Roussos, Panos, Fromer, Menachem, Kramer, Robin, Domenici, Enrico, Gamazon, Eric R., Purcell, Shaun, Demontis, Ditte, Børglum, Anders D., Walters, James T. R., O’Donovan, Michael C., Sullivan, Patrick, Owen, Michael J., Devlin, Bernie, Sieberts, Solveig K., Cox, Nancy J., Im, Hae Kyung, Sklar, Pamela, Stahl, Eli A.

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HIV prevalence and related risk factors among male sex workers in Shenzhen, China: results from a time–location sampling survey von Cai, Wen-De, Zhao, Jin, Zhao, Jin-Kou, Raymond, H F, Feng, Yu-Ji, Liu, Jie, McFarland, Willi, Gan, Yong-Xia, Yang, Zheng-Rong, Zhang, Yan, Tan, Jing-Guang, Wang, Xiao-Rong, He, Ming-Liang, Cheng, Jin-Quan, Chen, Lin

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Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II von Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, Cai, Yong Q.

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Publisher Correction: Gene expression imputation across multiple brain regions provides insights into schizophrenia risk von Huckins, Laura M., Dobbyn, Amanda, Ruderfer, Douglas M., Hoffman, Gabriel, Wang, Weiqing, Pardiñas, Antonio F., Rajagopal, Veera M., Als, Thomas D., T. Nguyen, Hoang, Girdhar, Kiran, Boocock, James, Roussos, Panos, Fromer, Menachem, Kramer, Robin, Domenici, Enrico, Gamazon, Eric R., Purcell, Shaun, Demontis, Ditte, Børglum, Anders D., Walters, James T. R., O’Donovan, Michael C., Sullivan, Patrick, Owen, Michael J., Devlin, Bernie, Sieberts, Solveig K., Cox, Nancy J., Im, Hae Kyung, Sklar, Pamela, Stahl, Eli A.

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Population‐based identity‐by‐descent mapping combined with exome sequencing to detect rare risk variants for schizophrenia von Kendler, Kenneth S., Walters, James, Blackwell, Jenefer M., Bramon, Elvira, Markus, Hugh S., Rautanen, Anna, Freeman, Colin, Hopkins, Lucinda, Edkins, Sarah, Bumpstead, Suzannah J., Dronov, Serge, Gillman, Matthew, Gray, Emma, Liddle, Jennifer, Potter, Simon C., Weston, Paul, Ripke, Stephan, Farh, Kai‐How, Holmans, Peter A., Lee, Phil, Huang, Hailiang, Bacanu, Silviu A., Belliveau, Richard A., Bene, Judit, Bigdeli, Tim B., Bruggeman, Richard, Cahn, Wiepke, Carrera, Noa, Cheung, Eric F. C., Cohen, David, Craddock, Nick, Davis, Kenneth L., Dinan, Timothy, Drapeau, Elodie, Dudbridge, Frank, Durmishi, Naser, Eichhammer, Peter, Farrell, Martilias S., Franke, Lude, Freimer, Nelson B., Friedman, Joseph I., Fromer, Menachem, Gratten, Jacob, Haroutunian, Vahram, Hartmann, Annette M., Henskens, Frans A., Hofman, Andrea, Hollegaard, Mads V., Joa, Inge, Keller, Matthew C., Klovins, Janis, Konte, Bettina, Kucinskiene, Zita Ausrele, Laurent, Claudine, Loughland, Carmel M., Mallet, Jacques, Mattheisen, Manuel, McCarley, Robert W., McDonald, Colm, Meier, Sandra, Meijer, Carin J., Metspalu, Andres, Milani, Lili, Milanova, Vihra, Mokrab, Younes, Myin‐Germeys, Inez, Nenadic, Igor, Nikitina‐Zake, Liene, O'Callaghan, Eadbhard, O'Neill, F. Anthony, Paunio, Tiina, Pejovic‐Milovancevic, Milica, Perkins, Diana O., Pietiläinen, Olli, Quested, Digby, Reichenberg, Abraham, Salomaa, Veikko, Scolnick, Edward M., Silagadze, Teimuraz, So, Hon‐Cheong, Spencer, Chris C. A., Suvisaari, Jaana, Szatkiewicz, Jin P., Thirumalai, Srinivas, Tosato, Sarah, Waddington, John, Wang, Qiang, Williams, Nigel M., Witt, Stephanie H., Wormley, Brandon K., Zheng, Xuebin, Zimprich, Fritz, Wray, Naomi R., Buxbaum, Joseph D., Jablensky, Assen V., Knight, Jo, Levinson, Douglas F., Malhotra, Anil K., Weinberger, Daniel R., Werge, Thomas

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Cross-oncopanel study reveals high sensitivity and accuracy with overall analytical performance depending on genomic regions von Gong, B, Li, D, Kusko, R, Novoradovskaya, N, Zhang, Y, Wang, S, Pabón-Peña, C, Zhang, Z, Lai, K, Cai, W, LoCoco, JS, Lader, E, Richmond, TA, Mittal, VK, Liu, LC, Johann, DJ, Willey, JC, Bushel, PR, Yu, Y, Xu, C, Chen, G, Burgess, D, Cawley, S, Giorda, K, Haseley, N, Qiu, F, Wilkins, K, Arib, H, Attwooll, C, Babson, K, Bao, L, Bao, W, Lucas, AB, Best, H, Bhandari, A, Bisgin, H, Blackburn, J, Blomquist, TM, Boardman, L, Burgher, B, Butler, DJ, Chang, CJ, Chaubey, A, Chen, T, Chierici, M, Chin, CR, Close, D, Conroy, J, Coleman, JC, Craig, DJ, Crawford, E, del Pozo, A, Deveson, IW, Duncan, D, Eterovic, AK, Fan, X, Foox, J, Furlanello, C, Ghosal, A, Glenn, S, Guan, M, Haag, C, Hang, X, Happe, S, Hennigan, B, Hipp, J, Hong, H, Horvath, K, Hu, J, Hung, LY, Kerkhof, J, Kipp, B, Kreil, DP, Łabaj, P, Lapunzina, P, Li, P, Li, QZ, Li, W, Li, Z, Liang, Y, Liu, S, Liu, Z, Ma, C, Marella, N, Martín-Arenas, R, Megherbi, DB, Meng, Q, Mieczkowski, PA, Morrison, T, Muzny, D, Ning, B, Parsons, BL, Paweletz, CP, Pirooznia, M, Qu, W, Raymond, A, Ringler, R, Sadikovic, B, Mercer, Timothy, Thomas, David

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ETSOI CMOS for system-on-chip applications featuring 22nm gate length, sub-100nm gate pitch, and 0.08µm2 SRAM cell von Cheng, K., Khakifirooz, A., Kulkarni, P., Ponoth, S., Haran, B., Kumar, A., Adam, T., Reznicek, A., Loubet, N., He, H., Kuss, J., Wang, M., Levin, T. M., Monsieur, F., Liu, Q., Sreenivasan, R., Cai, J., Kimball, A., Mehta, S., Luning, S., Zhu, Y., Zhu, Z., Yamamoto, T., Bryant, A., Lin, C., Naczas, S., Jagannathan, H., Edge, L. F., Allegret-Maret, S., Dube, A., Kanakasabapathy, S., Schmitz, S., Inada, A., Seo, S., Raymond, M., Zhang, Z., Yagishita, A., Demarest, J., Li, J., Hopstaken, M., Berliner, N., Upham, A., Johnson, R., Holmes, S., Standaert, T., Smalley, M., Zamdmer, N., Ren, Z., Wu, T., Bu, H., Paruchuri, V., Sadana, D., Narayanan, V., Haensch, W., O'Neill, J., Hook, T., Khare, M., Doris, B.

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ELECTROLUMINESCENCE ELEMENT von LI HONGBO, YAO JIANFEI, RI HO, LIU QI, RAYMOND KWONG CHI YUEN, WANG JUNFEI, YO GO, WANG YANG, SANG MING, WANG ZHEN, CAI WEI, XIA CHUANJUN, DING SHANG

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ETSOI CMOS for system-on-chip applications featuring 22nm gate length, sub-100nm gate pitch, and 0.08µm2 SRAM cell von Cheng, K., Khakifirooz, A., Kulkarni, P., Ponoth, S., Haran, B., Kumar, A., Adam, T., Reznicek, A., Loubet, N., He, H., Kuss, J., Wang, M., Levin, T. M., Monsieur, F., Liu, Q., Sreenivasan, R., Cai, J., Kimball, A., Mehta, S., Luning, S., Zhu, Y., Zhu, Z., Yamamoto, T., Bryant, A., Lin, C., Naczas, S., Jagannathan, H., Edge, L. F., Allegret-Maret, S., Dube, A., Kanakasabapathy, S., Schmitz, S., Inada, A., Seo, S., Raymond, M., Zhang, Z., Yagishita, A., Demarest, J., Li, J., Hopstaken, M., Berliner, N., Upham, A., Johnson, R., Holmes, S., Standaert, T., Smalley, M., Zamdmer, N., Ren, Z., Wu, T., Bu, H., Paruchuri, V., Sadana, D., Narayanan, V., Haensch, W., O'Neill, J., Hook, T., Khare, M., Doris, B.

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