Treffer 1 - 7 von 7 für Suche 'CRUZAN, GREG', Suchdauer: 0,33s Treffer weiter einschränken
  1. 1
    WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

    WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING von Hiroki, Ikeda, Ranganathan, Karthik, Cruzan, Greg, Kabbani, Samer, Ferrari, Paul, Toshiyuki, Kiyokawa

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  2. 2
    System and method for testing circuits of integrated circuit semiconductor wafer

    System and method for testing circuits of integrated circuit semiconductor wafer von CRUZAN, GREG, FERRARI, PAUL, IKEDA, HIROKI, RANGANATHAN, KARTHIK, KABBANI, SAMER, KIYOKAWA, TOSHIYUKI

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  3. 3
    Wafer scale active thermal interposer for device testing

    Wafer scale active thermal interposer for device testing von CRUZAN, GREG, FERRARI, PAUL, IKEDA, HIROKI, RANGANATHAN, KARTHIK, KABBANI, SAMER, KIYOKAWA, TOSHIYUKI

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  4. 4
    WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

    WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING von FERRARI PAUL, TOSHIYUKI KIYOKAWA, RANGANATHAN KARTHIK, HIROKI IKEDA, KABBANI SAMER, CRUZAN GREG

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  5. 5
    Thermal solution for massively parallel testing

    Thermal solution for massively parallel testing von GHAZVINI, MARC, OSEGUERA, GILBERTO, YAMASHITA, KAZUYUKI, LEVENTHAL, IRA, CRUZAN, GREG, IKEDA, HIROKI, FERRARI, PAUL, RANGANATHAN, KARTHIK, KABBANI, SAMER

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  6. 6
    Thermal solution for massively parallel testing

    Thermal solution for massively parallel testing von GHAZVINI, MARC, OSEGUERA, GILBERTO, YAMASHITA, KAZUYUKI, LEVENTHAL, IRA, CRUZAN, GREG, IKEDA, HIROKI, FERRARI, PAUL, RANGANATHAN, KARTHIK, KABBANI, SAMER

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  7. 7
    COTS MEMS Flow-Measurement Probes

    COTS MEMS Flow-Measurement Probes von Redding, Chip, Smith, Floyd A., Blank, Greg, Cruzan, Charles

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