Electro-optic phase modulation and optical second-harmonic generation in corona-poled polymer films von SINGER, K. D, KUZYK, M. G, HOLLAND, W. R, SOHN, J. E, LALAMA, S. J, COMIZZOLI, R. B, KATZ, H. E, SCHILLING, M. L

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Failure mechanism of avalanche photodiodes in the presence of water vapor von Comizzoli, R.B., Osenbach, J.W., Crane, G.R., Peins, G.A., Siconolfi, D.J., Lorimor, O.G., Chang, C.-C.

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Temperature-humidity-bias behavior and acceleration factors for nonhermetic uncooled InP-based lasers von Osenbach, J.W., Evanosky, T.L., Chand, N., Comizzoli, R.B., Krautter, H.W.

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Corrosion of Electronic Materials and Devices von Comizzoli, R. B., Frankenthal, R. P., Milner, P. C., Sinclair, J. D.

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Uses of corona discharges in the semiconductor industry von COMIZZOLI, R. B

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The Kuwait environment and its effects on electronic materials and components von COMIZZOLI, R. B, FRANEY, J. P, SPROLES, E. S, GRAEDEL, T. E, KAMMLOTT, G. W, MILLER, A. E, MULLER, A. J, PEINS, G. A, PSOTA-KELTY, L. A, SINCLAIR, J. D, WETZEL, R. C

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Electrochemical aspects of corrosion resistance and etching of metallizations for microelectronics von Comizzoli, R.B., Frankenthal, R.P., Hanson, K.J., Konstadinidis, K., Opila, R.L., Sapjeta, J., Sinclair, J.D., Takahashi, K.M., Frank, A.L., Ibidunni, A.O.

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Electrical conduction mechanism in semi-insulating polycrystalline silicon films von COMIZZOLI, R. B, OPILA, R. L

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Evaluation of high voltage IC's by corona charging von COMIZZOLI, R. B, OSENBACH, J. W

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high-reliability 1.3-μm InP-based uncooled lasers in nonhermetic packages von CHAND, N, OSENBACH, J. W, EVANOSKY, T. L, COMIZZOLI, R. B, TSANG, W. T

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Failure analysis of junction field effect transistor integrated circuits by corona charging von COMIZZOLI, R. B

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Corrosion of Electronic Materials and Devices by Submicron Atmospheric Particles von Comizzoli, R. B., Frankenthal, R.P., Lobnig, R.E., Peins, G.A., Psota-Kelty, L.A., Siconolfi, D.J., Sinclair, J.D.

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Stress free and moisture insensitive silicon oxide dielectric films formed by molecular-beam deposition von Chand, Naresh, Kola, R. R., Opila, R. L., Comizzoli, R. B., Krautter, H., Sergent, A. M., Tsang, W. T., Osenbach, J. W., Luftman, H. S.

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Fitting of data to a Frenkel-effect model of conduction in insulators von Comizzoli, R. B.

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Materials reliability issues with coaxial cable systems for the information superhighway von Comizzoli, R. B., Crane, G. R., Fiorino, M. E., Frankenthal, R. P., Krautter, H. W., Peins, G. A., Siconolfi, D. J., Sinclair, J. D.

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Reliability implications of lateral alkali-ion migration in MOS integrated circuits von SCHNABLE, G. L, SCHLESIER, K. M, WU, C. P, COMIZZOLI, R. B

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Transverse electric field dependence of conductivity in semi-insulating polycrystalline silicon von COMIZZOLI, R. B, WESTON, H. T, WONG, Y. H, KOHL, J. E

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Nondestructive, Reverse Decoration of Defects in IC Passivation Overcoats von Comizzoli, Robert B.

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Highly accelerated life testing for non-hermetic laser modules von Theis, C.D., Siconolfi, D.J., Comizzoli, R.B., Kiely, P.A., Wu, P., Chakrabarti, U.K., Osenbach, J.W.

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Robust materials and processes: Key to reliability von Comizzoli, Robert B., Landwehr, James M., Sinclair, J. Douglas

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