Influence of a-Si:H/ITO Interface Properties on Performance of Heterojunction Solar Cells von Lachaume, Raphaël, Favre, Wilfried, Scheiblin, Pascal, Garros, Xavier, Nguyen, Nathalie, Coignus, Jean, Munoz, Delfina, Reimbold, Gilles

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Resistive RAM Endurance: Array-Level Characterization and Correction Techniques Targeting Deep Learning Applications von Grossi, Alessandro, Vianello, Elisa, Sabry, Mohamed M., Barlas, Marios, Grenouillet, Laurent, Coignus, Jean, Beigne, Edith, Wu, Tony, Le, Binh Q., Wootters, Mary K., Zambelli, Cristian, Nowak, Etienne, Mitra, Subhasish

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Roadmap on ferroelectric hafnia- and zirconia-based materials and devices von Silva, José P. B., Alcala, Ruben, Avci, Uygar E., Barrett, Nick, Bégon-Lours, Laura, Borg, Mattias, Byun, Seungyong, Chang, Sou-Chi, Cheong, Sang-Wook, Choe, Duk-Hyun, Coignus, Jean, Deshpande, Veeresh, Dimoulas, Athanasios, Dubourdieu, Catherine, Fina, Ignasi, Funakubo, Hiroshi, Grenouillet, Laurent, Gruverman, Alexei, Heo, Jinseong, Hoffmann, Michael, Hsain, H. Alex, Huang, Fei-Ting, Hwang, Cheol Seong, Íñiguez, Jorge, Jones, Jacob L., Karpov, Ilya V., Kersch, Alfred, Kwon, Taegyu, Lancaster, Suzanne, Lederer, Maximilian, Lee, Younghwan, Lomenzo, Patrick D., Martin, Lane W., Martin, Simon, Migita, Shinji, Mikolajick, Thomas, Noheda, Beatriz, Park, Min Hyuk, Rabe, Karin M., Salahuddin, Sayeef, Sánchez, Florencio, Seidel, Konrad, Shimizu, Takao, Shiraishi, Takahisa, Slesazeck, Stefan, Toriumi, Akira, Uchida, Hiroshi, Vilquin, Bertrand, Xu, Xianghan, Ye, Kun Hee, Schroeder, Uwe

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(Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions von Molas, Gabriel, Sassine, Gilbert, Nail, Cecile, Alfaro Robayo, Diego, Nodin, Jean-François, Cagli, Carlo, Coignus, Jean, Blaise, Philippe, Nowak, Etienne

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Physically-based evaluation of aging contributions in HC/FN-programmed 40nm NOR Flash technology von Torrente, Giulio, Coignus, Jean, Vernhet, Alexandre, Ogier, Jean-Luc, Roy, David, Ghibaudo, Gérard

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Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology von Torrente, Giulio, Coignus, Jean, Vernhet, Alexandre, Ogier, Jean-Luc, Roy, David, Ghibaudo, Gérard

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Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40nm floating gate embedded-flash memory von Dobri, Adam, Jeannot, Simon, Piazza, Fausto, Jahan, Carine, Coignus, Jean, Perniola, Luca, Balestra, Francis

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Physically-based extraction methodology for accurate MOSFET degradation assessment von Torrente, Giulio, Coignus, Jean, Renard, Sophie, Vernhet, Alexandre, Reimbold, Gilles, Roy, David, Ghibaudo, Gerard

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METHOD FOR DETERMINING AN OPTIMAL VOLTAGE PULSE FOR PROGRAMMING A FLASH MEMORY CELL von COIGNUS, Jean

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METHOD FOR CO-FABRICATING A FERROELECTRIC MEMORY AND AN OXRAM RESISTIVE MEMORY AND DEVICE CO-INTEGRATING A FERROELECTRIC MEMORY AND AN OXRAM RESISTIVE MEMORY von COIGNUS, Jean, GRENOUILLET, Laurent, VIANELLO, Elisa

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SOLAR CELL WITH A SILICON HETEROJUNCTION von COIGNUS, Jean

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Method for determining an optimal voltage pulse for programming a flash memory cell von Coignus Jean

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SILICON HETEROJUNCTION SOLAR CELL von COIGNUS Jean

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Method for determining an optimal voltage pulse for programming a flash memory cell von COIGNUS Jean

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METHOD FOR CO-MANUFACTURING A FERROELECTRIC MEMORY AND AN OxRAM RESISTIVE MEMORY AND DEVICE CO-INTEGRATING A FERROELECTRIC MEMORY AND AN OxRAM RESISTIVE MEMORY von COIGNUS, Jean, GRENOUILLET, Laurent, VIANELLO, Elisa

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Recent Findings in Electrical Behavior of CMOS High-K Dielectric/Metal Gate Stacks von Ghibaudo, Gerard, Coignus, Jean, Charbonnier, Mathieu, Mitard, Jerome, Leroux, Charles, Garros, Xavier, Clerc, Raphael, Reimbold, Gilles

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SYSTEM FOR CHARACTERISING A FLASH MEMORY CELL von COIGNUS, Jean, VERNHET, Alexandre

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SOLAR CELL WITH A SILICON HETEROJUNCTION von COIGNUS, JEAN

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Solar cell with a silicon heterojunction von COIGNUS JEAN

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CELLULE SOLAIRE A HETEROJONCTION DE SILICIUM von COIGNUS JEAN

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