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  1. 1
    METHOD FOR CONTACT-FREE DETERMINATION OF LIFE SPAN FOR NON-EQUILIBRIUM CARRIERS IN SEMI-CONDUCTORS

    METHOD FOR CONTACT-FREE DETERMINATION OF LIFE SPAN FOR NON-EQUILIBRIUM CARRIERS IN SEMI-CONDUCTORS von FEDORTSOV ALEKSANDR BORISOVICH, GONCHAR IGOR' VALER'EVICH, CHURKIN JURIJ VALENTINOVICH, IVANOV ALEKSEJ SERGEEVICH, MANUKHOV VASILIJ VLADIMIROVICH

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  2. 2
    METHOD FOR MEASUREMENT OF LIFE SPAN OF NONEQUILIBRIUM CARRIERS IN SEMI-CONDUCTORS

    METHOD FOR MEASUREMENT OF LIFE SPAN OF NONEQUILIBRIUM CARRIERS IN SEMI-CONDUCTORS von FEDORTSOV ALEKSANDR BORISOVICH, CHURKIN JURIJ VALENTINOVICH, IVANOV ALEKSEJ SERGEEVICH, ANIKEICHEV ALEKSANDR VLADIMIROVICH, MANUKHOV VASILIJ VLADIMIROVICH

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  3. 3
    APPARATUS FOR CONTACTLESS MEASUREMENT OF LIFETIME OF NONEQUILIBRIUM CHARGE CARRIERS SEMICONDUCTORS (VERSIONS)

    APPARATUS FOR CONTACTLESS MEASUREMENT OF LIFETIME OF NONEQUILIBRIUM CHARGE CARRIERS SEMICONDUCTORS (VERSIONS) von FEDORTSOV ALEKSANDR BORISOVICH, GONCHAR IGOR' VALER'EVICH, CHURKIN JURIJ VALENTINOVICH, IVANOV ALEKSEJ SERGEEVICH, ANIKEICHEV ALEKSANDR VLADIMIROVICH

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  4. 4
    DEVICE FOR NON-DESTRUCTIVE MEASUREMENT OF DIELECTRIC AND SEMICONDUCTOR FILM THICKNESS

    DEVICE FOR NON-DESTRUCTIVE MEASUREMENT OF DIELECTRIC AND SEMICONDUCTOR FILM THICKNESS von FEDORTSOV ALEKSANDR BORISOVICH, CHURKIN JURIJ VALENTINOVICH, IVANOV ALEKSEJ SERGEEVICH, MANUKHOV VASILIJ VLADIMIROVICH

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