Modeling the time-dependence of the photoreflectance spectroscopy on ultra-shallow As+ ion implanted silicon von Chouaib, Houssam

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Nanoscale optical critical dimension measurement of a contact hole using deep ultraviolet spectroscopic ellipsometry von Chouaib, Houssam, Zhao, Qiang

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Microphotoreflectance spectroscopy of heterojunction bipolar transistors under biasing voltage: Measurement of the net doping concentration von Chouaib, Houssam, Bru-Chevallier, Catherine

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Measuring thin films on grating and bandgap on grating von Chouaib, Houssam, Tan, Zhengquan

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Surface Fermi level in GaAsSb structures grown by molecular beam epitaxy on InP substrates von Chouaib, Houssam, Bru-Chevallier, Catherine, Apostoluk, Aleksandra, Rudno-Rudzinski, Wojciech, Lijadi, Melania, Bove, Philippe

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Rapid photoreflectance spectroscopy for strained silicon metrology von Chouaib, H., Murtagh, M. E., Guènebaut, V., Ward, S., Kelly, P. V., Kennard, M., Le Vaillant, Y. M., Somekh, M. G., Pitter, M. C., Sharples, S. D.

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Measurement models of nanowire semiconductor structures based on re-useable sub-structures von Chouaib, Houssam, Kuznetsov, Alexander

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Photoreflectance study of GaAsSb ∕ InP heterostructures von Chouaib, H., Bru-Chevallier, C., Guillot, G., Lahreche, H., Bove, P.

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Methods And Systems For Measurement Of Semiconductor Structures Based On Derivative Measurement Signals von Chouaib, Houssam, Shaughnessy, Derrick, Tan, Zhengquan

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METHODS AND SYSTEMS FOR MEASUREMENT OF SEMICONDUCTOR STRUCTURES BASED ON DERIVATIVE MEASUREMENT SIGNALS von TAN, Zhengquan, CHOUAIB, Houssam, SHAUGHNESSY, Derrick

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Measuring Thin Films on Grating and Bandgap on Grating von Chouaib, Houssam, Tan, Zhengquan

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Measuring thin films on grating and bandgap on grating von Chouaib, Houssam, Tan, Zhengquan

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Photoreflectance spectroscopy for the study of GaAsSb/InP heterojunction bipolar transistors von Bru-Chevallier, C., Chouaib, H., Arcamone, J., Benyattou, T., Lahreche, H., Bove, P.

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UV photoreflectance spectroscopy in strained silicon on insulator structures von Munguía, Jacobo, Bluet, Jean-Marie, Chouaib, Houssam, Bremond, Georges, Bru-Chevallier, Catherine

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Measurement Models Of Nanowire Semiconductor Structures Based On Re-Useable Sub-Structures von Chouaib, Houssam, Kuznetsov, Alexander

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MEASUREMENT MODELS OF NANOWIRE SEMICONDUCTOR STRUCTURES BASED ON RE-USABLE SUB-STRUCTURES von CHOUAIB, Houssam, KUZNETSOV, Alexander

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Measuring Thin Films on Grating and Bandgap on Grating von Chouaib, Houssam, Tan, Zhengquan

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MEASURING THIN FILMS ON GRATING AND BANDGAP ON GRATING von TAN, Zhengquan, CHOUAIB, Houssam

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Method, computer program product, and system for measuring thin films von CHOUAIB, HOUSSAM, TAN, ZHENGQUAN

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Photoreflectance spectroscopy for the qualification of GaAsSb alloys introduced in ultrafast heterojunction bipolar transistors on InP von Chouaib, Houssam, Bru-Chevallier, Catherine, Apostoluk, Aleksandra, Rudno-Rudzinski, Wojciech, Pelouard, Jean-Luc, Lijadi, Melania, Bove, Philippe

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