An efficient mutual authentication RFID scheme based on elliptic curve cryptography von Chou, Jue-Sam

Volltext

A constant-time identifying large-scale RFID tags using lines on a plane von Chou, Jue-Sam

Volltext

A novel mutual authentication scheme based on quadratic residues for RFID systems von Chen, Yalin, Chou, Jue-Sam, Sun, Hung-Min

Volltext

ECC-based untraceable authentication for large-scale active-tag RFID systems von Chen, Yalin, Chou, Jue-Sam

Volltext

A Novel k-out-of-n Oblivious Transfer Protocol from Bilinear Pairing von Chou, Jue-Sam

Volltext

A Novel Anonymous Proxy Signature Scheme von Chou, Jue-Sam

Volltext

Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs von Sheng-Chun Wang, Pin Su, Kun-Ming Chen, Bo-Yuan Chen, Guo-Wei Huang, Cheng-Chou Hung, Sheng-Yi Huang, Cheng-Wen Fan, Chih-Yuh Tzeng, Chou, S

Volltext

Improved multi-server authentication protocol von Huang, Chun-Hui, Chou, Jue-Sam, Chen, Yalin, Wun, Siang Yu

Volltext

Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure von Chen, Ming-Shing, Fang, Yean-Kuen, Juang, Feng-Renn, Chiang, Yen-Ting, Lin, Cheng-I, Lee, Tung-Hsing, Tseng, Chih-Yu, Chou, Sam, Chen, Chii-Wen

Volltext

A novel electronic cash system with trustee-based anonymity revocation from pairing von Chen, Yalin, Chou, Jue-Sam, Sun, Hung-Min, Cho, Ming-Hsun

Volltext

Mental poker game based on a bit commitment scheme through network von Chou, Jue-Sam, Yeh, Yi-Shiung

Volltext

A response to a critique of “A novel electronic cash system with trustee-based anonymity revocation from pairing,” by Chen, Chou, Sun and Cho (2011) von Chen, Yalin, Chou, Jue-Sam, Sun, Hung-Min, Cho, Ming-Sun

Volltext

Power improvement for 65nm nMOSFET with high-tensile CESL and fast nonlinear behavior modeling von Chia-Sung Chiu, Kun-Ming Chen, Guo-Wei Huang, Shu-Yu Lin, Bo-Yuan Chen, Cheng-Chou Hung, Sheng-Yi Huang, Cheng-Wen Fan, Chih-Yuh Tzeng, Sam Chou

Volltext

Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors of 0.13 µm Technology von Chen, Shuang-Yuan, Tu, Chia-Hao, Lin, Jung-Chun, Wang, Mu-Chun, Kao, Po-Wei, Lin, Memg-Hong, Wu, Ssu-Han, Jhou, Ze-Wei, Chou, Sam, Ko, Joe, Haung, Heng-Sheng

Volltext

An efficient session key generation for NTDR networks based on bilinear paring von Chou, Jue-Sam, Chen, Yalin, Chen, Tsung-Heng

Volltext

Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications von Chen, Shuang-Yuan, Lin, Jung-Chun, Chen, Hung-Wen, Lin, Hung-Chuan, Jhou, Ze-Wei, Chou, Sam, Ko, Joe, Lei, Tien-Fu, Haung, Heng-Sheng

Volltext

Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for n-Channel Metal–Oxide–Semiconductor Field-Effect-Transistor of 0.13 µm Technology von Lin, Jung-Chun, Chen, Shuang-Yuan, Chen, Hung-Wen, Jhou, Ze-Wei, Lin, Hung-Chuan, Chou, Sam, Ko, Joe, Lei, Tien-Fu, Haung, Heng-Sheng

Volltext

Temperature Effects on the Hot-Carrier Induced Degradation of pMOSFETs von Shuang-Yuan Chen, Chia-Hao Tu, Jung-Chun Lin, Po-Wei Kao, Wen-Cheng Lin, Ze-Wei Jhou, Sam Chou, Joe Ko, Heng-Sheng Haung

Volltext

RADIATION-EMITTING COMPONENT AND METHOD FOR PRODUCING A RADIATION-EMITTING COMPONENT von HAIBERGER, Luca, CHOU, Sam

Volltext bestellen

Radiation-emitting component and method for producing a radiation-emitting component von Haiberger, Luca, Chou, Sam

Volltext bestellen