TRANSACTION-LEVEL RISK ASSESSMENT BASED ON HIGHER-LEVEL ACCOUNT REPUTATION SCORE von ZHONG, Zimin, BIAGI, Amir Reza, CHIN, Shao Ou, NANDAKUMAR, Vishnu, SHEN, Jun, LONG, Qiuyu, LAI, Di

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TRANSACTION-LEVEL RISK ASSESSMENT BASED ON HIGHER-LEVEL ACCOUNT REPUTATION SCORE von BIAGI, Amir Reza, Long, Qiuyu, Lai, Di, NANDAKUMAR, Vishnu, Shen, Jun, Chin, Shao Ou, Zhong, Zimin

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QUEUE MANAGEMENT WITH DYNAMIC PRIORITIZATION von CHIN, Shao Ou, XUE, Qi, NIES, Trevor Eugene, KAMAYASWAMI, Rajkumar

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QUEUE MANAGEMENT WITH DYNAMIC PRIORITIZATION von CHIN, Shao Ou, XUE, Qi, NIES, Trevor Eugene, KAMAYASWAMI, Rajkumar

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Comprehensive PM2.5 Organic Molecular Composition and Stable Carbon Isotope Ratios at Sonla, Vietnam: Fingerprint of Biomass Burning Components von Nguyen, Dac Loc, Kawamura, Kimitaka, Ono, Kaori, Ram, Shidharth Sankar, Engling, Guenter, Lee, Chung-Te, Lin, Neng-Huei, Chang, Shuenn-Chin, Chuang, Ming-Tung, Hsiao, Ta-Chih, Sheu, Guey-Rong, Yang, Chang-Feng Ou, Chi, Kai Hsien, Sun, Shao-An

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Physical activity modifies cognitive impairment-associated mortality risks among chronic kidney disease von Tsai, Ming-Tsun, Lin, Yi-Sheng, Huang, Shao-Sung, Weng, Shuo-Chun, Yang, Chih-Yu, Lee, Kuo-Hua, Ou, Shuo-Ming, Lin, Yao-Ping, Huang, Chin-Chou, Tseng, Wei-Cheng, Tarng, Der-Cherng

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Expanding the use of salivary cortisol as a non-invasive outpatient test in the dynamic evaluation of suspected adrenal insufficiency von Tan, Sarah Ying Tse, Tan, Hong Chang, Zhu, Ling, Loh, Lih Ming, Lim, Dawn Shao Ting, Du Soon, Swee, Chan, Yoke Ling, Lim, Huee Boon, Ling, Shiau Lee, Ou, En Jun, Teo, Wynn Ee, Zhang, Xiao Ping, Goh, Hui Fen, Kek, Peng Chin

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Conductive interconnect structures in integrated circuits von Liao, Chi-Hung, Ou Yang, Liang-Yueh, Lien, Shao Tzu, Lee, Chin-Szu, Wu, Szu-Hua, Wu, Jung-Tang

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Conductive Interconnect Structures in Integrated Circuits von Liao, Chi-Hung, Ou Yang, Liang-Yueh, Lien, Shao Tzu, Lee, Chin-Szu, Wu, Szu-Hua, Wu, Jung-Tang

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Conductive interconnect structures in integrated circuits von Liao, Chi-Hung, Ou Yang, Liang-Yueh, Lien, Shao Tzu, Lee, Chin-Szu, Wu, Szu-Hua, Wu, Jung-Tang

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Conductive Interconnect Structures in Integrated Circuits von Liao, Chi-Hung, Ou Yang, Liang-Yueh, Lien, Shao Tzu, Lee, Chin-Szu, Wu, Szu-Hua, Wu, Jung-Tang

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A 25-nm gate-length FinFET transistor module for 32nm node von Chang-Yun Chang, Tsung-Lin Lee, Wann, C., Li-Shyue Lai, Hung-Ming Chen, Chih-Chieh Yeh, Chih-Sheng Chang, Chia-Cheng Ho, Jyh-Cherng Sheu, Tsz-Mei Kwok, Feng Yuan, Shao-Ming Yu, Chia-Feng Hu, Jeng-Jung Shen, Yi-Hsuan Liu, Chen-Ping Chen, Shin-Chih Chen, Li-Shiun Chen, Chen, L., Yuan-Hung Chiu, Chu-Yun Fu, Ming-Jie Huang, Yu-Lien Huang, Shih-Ting Hung, Jhon-Jhy Liaw, Hsien-Chin Lin, Hsien-Hsin Lin, Lin, L.-T.S., Shyue-Shyh Lin, Yuh-Jier Mii, Ou-Yang, E., Ming-Feng Shieh, Chien-Chang Su, Shih-Peng Tai, Hun-Jan Tao, Ming-Huan Tsai, Kai-Ting Tseng, Kin-Weng Wang, Shiang-Bau Wang, Xu, J.J., Fu-Kai Yang, Shu-Tine Yang, Chen-Nan Yeh

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A method of forming a semiconductor device von WU, SZU-HUA, LEE, CHIN-SZU, WU, JUNG-TANG, LIAO, CHI-HUNG, LIEN, SHAO TZU, OU YANG, LIANG-YUEH

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Method of forming semiconductor device von LIAO CHI-HUNG, LEE CHIN-SZU, LIEN SHAO TZU, WU JUNG-TANG, WU SZU-HUA, OU YANG LIANG-YUEH

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