Real-time etch-depth measurements of MEMS devices von Bosch-Charpenay, S., Jiazhan Xu, Haigis, J., Rosenthal, P.A., Solomon, P.R., Bustillo, J.M.

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A characterization method and model for predicting coal conversion behaviour von Solomon, Peter R., Hamblen, David G., Serio, Michael A., Yu, Zhen-Zhong, Charpenay, Sylvie

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Measurement and modeling of lignin pyrolysis von Serio, Michael A., Charpenay, Sylvie, Bassilakis, Rosemary, Solomon, Peter R.

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Influence of Maturation on the Pyrolysis Products from Coals and Kerogens. 1. Experiment von Charpenay, Sylvie, Serio, Michael A, Bassilakis, Rosemary, Solomon, Peter R

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Modeling of biomass pyrolysis kinetics von Chen, Yonggang, Charpenay, Sylvie, Jensen, Anker, Wójtowicz, Marek A., Serio, Michael A.

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VERFAHREN UND VORRICHTUNG ZUR MESSUNG DER ZUSAMMENSETZUNG UND ANDERER EIGENSCHAFTEN VON DÜNNFILMEN von ROSENTHAL, PETER, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR

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Influence of Maturation on the Pyrolysis Products from Coals and Kerogens. 2. Modeling von Charpenay, Sylvie, Serio, Michael A, Bassilakis, Rosemary, Solomon, Peter R, Landais, Patrick

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METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS von ROSENTHAL, PETER, A, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR, A

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The prediction of coal char reactivity under combustion conditions von Charpenay, Sylvie, Serio, Michael A., Solomon, Peter R.

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METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS von ROSENTHAL, PETER, A, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR, A

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Method and apparatus of signal processing in spectrometry using an improved apodization function von BOSCH CHARPENAY SYLVIE

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Thermal imaging for semiconductor process monitoring von Rosenthal, Peter A, Xu, Jiazhan, Charpenay, Sylvie, Cosgrove, Joseph E

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Method and apparatus of signal processing for use in spectrometry using an improved apodization function von Bosch-Charpenay, Sylvie, Marshik-Geurts, Barbara J, Kamlet, Leonard I, Neira, Jorge E, Marran, David F

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METHOD AND APPARATUS OF SIGNAL PROCESSING IN SPECTROMETRY USING AN IMPROVED APODIZATION FUNCTION von MARRAN DAVID F, MARSHIK GEURTS BARBARA J, KAMLET LEONARD I, NEIRA JORGE E, BOSCH CHARPENAY SYLVIE

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Thermal imaging for semiconductor process monitoring von XU JIAZHAN, COSGROVE JOSEPH E, CHARPENAY SYLVIE, ROSENTHAL PETER A

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Method and apparatus for measuring the composition and other properties of thin films utilizing infrared radiation von YAKOVLEV VICTOR A, CHARPENAY SYLVIE, ROSENTHAL PETER A

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Method and apparatus for measuring the composition and other properties of thin films utilizing infrared radiation von Rosenthal, Peter A, Charpenay, Sylvie, Yakovlev, Victor A

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METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS von ROSENTHAL, PETER, A, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR, A

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Method and apparatus for measuring the composition and other properties of thin films von PETER A. ROSENTHAL, VICTOR A. YAKOVLEV, SYLVIE CHARPENAY

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METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS von ROSENTHAL, PETER, A, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR, A

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