Importance of standard terminology in surface chemical analysis: ISO 18115‐1:2023, general terms and terms used in spectroscopy von Shard, Alexander G., Baer, Donald R., Clifford, Charles A.

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Advancements in Remote Alpha Radiation Detection: Alpha-Induced Radio-Luminescence Imaging with Enhanced Ambient Light Suppression von Kong, Lingteng, Scott, Thomas Bligh, Day, John Charles Clifford, Megson-Smith, David Andrew

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Long-Range Imaging of Alpha Emitters Using Radioluminescence in Open Environments: Daytime and Night-Time Applications von Kong, Lingteng, Scott, Thomas Bligh, Day, John Charles Clifford, Megson-Smith, David Andrew

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Standard Approaches to XPS and AES Quantification—A Summary of ISO 18118:2024 on the Use of Relative Sensitivity Factors von Cant, David J. H., Gorham, Justin M., Clifford, Charles A., Shard, Alexander G.

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Terminology: the first step towards international standardisation of graphene and related 2D materials von Pollard, Andrew J., Clifford, Charles A.

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Multifunctional Nanoprobes for Nanoscale Chemical Imaging and Localized Chemical Delivery at Surfaces and Interfaces von Takahashi, Yasufumi, Shevchuk, Andrew I., Novak, Pavel, Zhang, Yanjun, Ebejer, Neil, Macpherson, Julie V., Unwin, Patrick R., Pollard, Andrew J., Roy, Debdulal, Clifford, Charles A., Shiku, Hitoshi, Matsue, Tomokazu, Klenerman, David, Korchev, Yuri E.

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Contemporary prevalence of infectious agents in laboratory mice and rats von Pritchett-Corning, Kathleen R, Cosentino, Janice, Clifford, Charles B

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Summary of ISO/TC 201 standard: ISO 11775:2015 – Surface chemical analysis – Scanning probe microscopy – Determination of cantilever normal spring constants von Clifford, Charles A.

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Composition, thickness, and homogeneity of the coating of core–shell nanoparticles—possibilities, limits, and challenges of X-ray photoelectron spectroscopy von Radnik, Jörg, Knigge, Xenia, Andresen, Elina, Resch-Genger, Ute, Cant, David J. H., Shard, Alex G., Clifford, Charles A.

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Towards easy and reliable AFM tip shape determination using blind tip reconstruction von Flater, Erin E., Zacharakis-Jutz, George E., Dumba, Braulio G., White, Isaac A., Clifford, Charles A.

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The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis von Clifford, Charles A, Seah, Martin P

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Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation von Clifford, Charles A., Seah, Martin P.

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Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of... von Shard, Alexander G., Havelund, Rasmus, Seah, Martin P., Clifford, Charles A.

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Influence of the Morphology on the Functionalization of Graphene Nanoplatelets Analyzed by Comparative Photoelectron Spectroscopy with Soft and Hard X‐Rays von Chemello, Giovanni, Knigge, Xenia, Ciornii, Dmitri, Reed, Benjamen P., Pollard, Andrew J., Clifford, Charles A., Howe, Tom, Vyas, Neil, Hodoroaba, Vasile‐Dan, Radnik, Jörg

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Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison von Bu, Tianjia, Gao, Huifang, Yao, Yaxuan, Wang, Jianfeng, Pollard, Andrew J, Legge, Elizabeth J, Clifford, Charles A, Delvallée, Alexandra, Ducourtieux, Sébastien, Lawn, Malcolm A, Babic, Bakir, Coleman, Victoria A, Jämting, Åsa, Zou, Shan, Chen, Maohui, Jakubek, Zygmunt J, Iacob, Erica, Chanthawong, Narin, Mongkolsuttirat, KittiSun, Zeng, Guanghong, Almeida, Clara Muniz, He, Bo-Ching, Hyde, Lachlan, Ren, Lingling

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Particle size distributions for cellulose nanocrystals measured by atomic force microscopy: an interlaboratory comparison von Bushell, Michael, Meija, Juris, Chen, Maohui, Batchelor, Warren, Browne, Christine, Cho, Jae-Young, Clifford, Charles A., Al-Rekabi, Zeinab, Vanderfleet, Oriana M., Cranston, Emily D., Lawn, Malcolm, Coleman, Victoria A., Nyström, Gustav, Arcari, Mario, Mezzenga, Raffaele, Park, Byong Chon, Shin, ChaeHo, Ren, Lingling, Bu, Tianjia, Saito, Tsuguyuki, Kaku, Yuto, Wagner, Ryan, Johnston, Linda J.

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Response to ACS Nano Editorial “Standardizing Nanomaterials” von Aublant, Jean-Marc, Clifford, Charles A, Frejafon, Emeric, Fujimoto, Toshiyuki, Hackley, Vincent A, Herrmann, Jan, Hight Walker, Angela R, Kaiser, Debra L, Koltsov, Denis K, Michael, David J, Ono, Akira, Roebben, Gert, Smallwood, Gregory J, Taketoshi, Naoyuki

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Summary of ISO/TC 201 Technical Report 23173—Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings von Cant, David J. H., Müller, Anja, Clifford, Charles A., Unger, Wolfgang E. S., Shard, Alexander G.

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Challenges in the size analysis of a silica nanoparticle mixture as candidate certified reference material von Kestens, Vikram, Roebben, Gert, Herrmann, Jan, Jämting, Åsa, Coleman, Victoria, Minelli, Caterina, Clifford, Charles, De Temmerman, Pieter-Jan, Mast, Jan, Junjie, Liu, Babick, Frank, Cölfen, Helmut, Emons, Hendrik

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Importance of sample preparation on reliable surface characterisation of nano‐objects: ISO standard 20579‐4 von Baer, Donald R., Karakoti, Ajay S., Clifford, Charles A., Minelli, Caterina, Unger, Wolfgang E. S.

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