Prolonged 500 °C Demonstration of 4H-SiC JFET ICs With Two-Level Interconnect von Spry, David J., Neudeck, Philip G., Liangyu Chen, Lukco, Dorothy, Chang, Carl W., Beheim, Glenn M.

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Optimization of TaSi2 Processing for 500 °C Durable SiC JFET-R Integrated Circuits von Spry, David J., Rajgopal, Srihari, Neudeck, Philip G., Chang, Carl W., Gonzalez, Jose M.

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Experimental Study on Mitigation of Lifetime-Limiting Dielectric Cracking in Extreme Temperature 4H-SiC JFET Integrated Circuits von Neudeck, Philip G., Spry, David J., Chang, Carl W.

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Stable Electrical Operation of 6H-SiC JFETs and ICs for Thousands of Hours at 500 °C von NEUDECK, Philip G, SPRY, David J, PROKOP, Norman F, CHEN, Liang-Yu, BEHEIM, Glenn M, OKOJIE, Robert S, CHANG, Carl W, MEREDITH, Roger D, FERRIER, Terry L, EVANS, Laura J, KRASOWSKI, Michael J

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Processing and Prolonged 500 °C Testing of 4H-SiC JFET Integrated Circuits with Two Levels of Metal Interconnect von Beheim, Glenn M., Krasowski, Michael J., Chang, Carl W., Neudeck, Philip G., Prokop, Norman F., Spry, David J., Lukco, Dorothy, Chen, Liang Yu

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Prolonged 500°C Operation of 100+ Transistor Silicon Carbide Integrated Circuits von Spry, David J., Chen, Liang Yu, Lukco, Dorothy, Krasowski, Michael J., Chang, Carl W., Neudeck, Philip G., Prokop, Norman F., Beheim, Glenn M.

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Experimentally observed electrical durability of 4H-SiC JFET ICs operating from 500 °C to 700 °C von Neudeck, Philip G., Spry, David J., Liangyu Chen, Lukco, Dorothy, Chang, Carl W., Beheim, Glenn M.

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Evidence of Processing Non-Idealities in 4H-SiC Integrated Circuits Fabricated with Two Levels of Metal Interconnect von Chen, Liang Yu, Neudeck, Philip G., Beheim, Glenn M., Chang, Carl W., Lukco, Dorothy, Evans, Laura J., Spry, David J.

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Reducing DRIE-Induced Trench Effects in SiC Pressure Sensors Using FEA Prediction von Okojie, Robert S., Chang, Carl W., Evans, Laura J.

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Electrical Characterization of a 4H-SiC JFET Wafer: DC Parameter Variations for Extreme Temperature IC Design von Spry, David J., Neudeck, Philip G., Chen, Liang Yu, Chang, Carl W., Beheim, Glenn M.

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Prolonged 500 °C Operation of 6H-SiC JFET Integrated Circuitry von Spry, David J., Krasowski, Michael J., Chen, Liang Yu, Meredith, Roger D., Neudeck, Philip G., Chang, Carl W., Prokop, Norman F., Ferrier, Terry L., Beheim, Glenn M., Evans, Laura J., Okojie, Robert S.

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Stable Electrical Operation of 6H-SiC JFETs and ICs for Thousands of Hours at 500 ^\hbox von Neudeck, P.G., Spry, D.J., Liang-Yu Chen, Beheim, G.M., Okojie, R.S., Chang, C.W., Meredith, R.D., Ferrier, T.L., Evans, L.J., Krasowski, M.J., Prokop, N.F.

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Year-long 500°C Operational Demonstration of Up-scaled 4H-SiC JFET Integrated Circuits von Neudeck, Philip G., Spry, David J., Krasowski, Michael J., Prokop, Norman F., Beheim, Glenn M., Chen, Liang-Yu, Chang, Carl W.

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4H-SiC JFET Multilayer Integrated Circuit Technologies Tested up to 1000 K von Spry, David J, Neudeck, Phil G, Chen, Liangyu, Chang, Carl W, Lukco, Dorothy, Beheim, Glenn M.

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Fabrication and Testing of 6H-SiC JFETs for Prolonged 500 °C Operation in Air Ambient von Spry, David J., Chen, Liang Yu, Meredith, Roger D., Neudeck, Philip G., Chang, Carl W., Ferrier, Terry L., Beheim, Glenn M., Evans, Laura J., Okojie, Robert S.

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Recent Progress in Extreme Environment Durable SiC JFET-R Integrated Circuit Technology von Neudeck, Philip G., Spry, David J., Krasowski, Michael J., Chang, Carl W., Gonzalez, José M., Rajgopal, Srihari, Prokop, Norman F., Greer, Lawrence C., Lukco, Dorothy, Maldonado-Rivera, Shamir, Adams, Christina M.

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Characterization of Silicon Carbide Pressure Sensors at 800 °C von Okojie, Robert S., Lukco, Dorothy, Chang, Carl W., Savrun, Ender

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Fabrication and Testing of 6H-SiC JFETs for Prolonged 500 deg C Operation in Air Ambient von Spry, David J, Neudeck, Philip G, Chen, Liang-Yu, Beheim, Glenn M, Okojie, Robert S, Chang, Carl W, Meredith, Roger D, Ferrier, Terry L, Evans, Laura J

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Prolonged 500 deg C operation of 6H-SiC JFET integrated circuitry von Neudeck, Philip G, Spry, David J, Chen, Liang-Yu, Chang, Carl W, Beheim, Glenn M, Okojie, Robert S, Evans, Laura J, Meredith, Roger D, Ferrier, Terry L, Krasowski, Michael J, Prokop, Norman F

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In-Line Electromagnetic Actuator for Fuel Modulation von Okojie, Robert S., Chang, Carl W., Meredith, Roger D., Thomas, Randy, Kopasakis, George

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