Creation and diagnosis of a solid-density plasma with an X-ray free-electron laser von Vinko, S. M., Ciricosta, O., Cho, B. I., Engelhorn, K., Chung, H.-K., Brown, C. R. D., Burian, T., Chalupský, J., Falcone, R. W., Graves, C., Hájková, V., Higginbotham, A., Juha, L., Krzywinski, J., Lee, H. J., Messerschmidt, M., Murphy, C. D., Ping, Y., Scherz, A., Schlotter, W., Toleikis, S., Turner, J. J., Vysin, L., Wang, T., Wu, B., Zastrau, U., Zhu, D., Lee, R. W., Heimann, P. A., Nagler, B., Wark, J. S.

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The soft x-ray instrument for materials studies at the linac coherent light source x-ray free-electron laser von Schlotter, W. F., Turner, J. J., Rowen, M., Heimann, P., Holmes, M., Krupin, O., Messerschmidt, M., Moeller, S., Krzywinski, J., Soufli, R., Fernández-Perea, M., Kelez, N., Lee, S., Coffee, R., Hays, G., Beye, M., Gerken, N., Sorgenfrei, F., Hau-Riege, S., Juha, L., Chalupsky, J., Hajkova, V., Mancuso, A. P., Singer, A., Yefanov, O., Vartanyants, I. A., Cadenazzi, G., Abbey, B., Nugent, K. A., Sinn, H., Lüning, J., Schaffert, S., Eisebitt, S., Lee, W.-S., Scherz, A., Nilsson, A. R., Wurth, W.

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Time-Resolved XUV Opacity Measurements of Warm Dense Aluminum von Vinko, S. M., Vozda, V., Andreasson, J., Bajt, S., Bielecki, J., Burian, T., Chalupsky, J., Ciricosta, O., Desjarlais, M. P., Fleckenstein, H., Hajdu, J., Hajkova, Hollebon, P., Juha, L., Kasim, M. F., McBride, E. E., Muehlig, K., Preston, T. R., Rackstraw, D. S., Roling, S., Toleikis, S., Wark, J. S., Zacharias, H.

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Detachment of epitaxial graphene from SiC substrate by XUV laser radiation von Vozda, V., Medvedev, N., Chalupský, J., Čechal, J., Burian, T., Hájková, V., Juha, L., Krůs, M., Kunc, J.

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Femtosecond x-ray diffraction can discern nonthermal from thermal melting von Medvedev, N., Kopecky, M., Chalupsky, J., Juha, L.

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Electronic structure of an XUV photogenerated solid-density aluminum plasma von Vinko, S M, Zastrau, U, Mazevet, S, Andreasson, J, Bajt, S, Burian, T, Chalupsky, J, Chapman, H N, Cihelka, J, Doria, D, Döppner, T, Düsterer, S, Dzelzainis, T, Fäustlin, R R, Fortmann, C, Förster, E, Galtier, E, Glenzer, S H, Göde, S, Gregori, G, Hajdu, J, Hajkova, V, Heimann, P A, Irsig, R, Juha, L, Jurek, M, Krzywinski, J, Laarmann, T, Lee, H J, Lee, R W, Li, B, Meiwes-Broer, K-H, Mithen, J P, Nagler, B, Nelson, A J, Przystawik, A, Redmer, R, Riley, D, Rosmej, F, Sobierajski, R, Tavella, F, Thiele, R, Tiggesbäumker, J, Toleikis, S, Tschentscher, T, Vysin, L, Whitcher, T J, White, S, Wark, J S

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Comparing different approaches to characterization of focused X-ray laser beams von Chalupsky, J., Bohacek, P., Hajkova, V., Hau-Riege, S.P., Heimann, P.A., Juha, L., Krzywinski, J., Messerschmidt, M., Moeller, S.P., Nagler, B., Rowen, M., Schlotter, W.F., Swiggers, M.L., Turner, J.J.

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Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure von Khorsand, A R, Sobierajski, R, Louis, E, Bruijn, S, van Hattum, E D, van de Kruijs, R W E, Jurek, M, Klinger, D, Pelka, J B, Juha, L, Burian, T, Chalupsky, J, Cihelka, J, Hajkova, V, Vysin, L, Jastrow, U, Stojanovic, N, Toleikis, S, Wabnitz, H, Tiedtke, K, Sokolowski-Tinten, K, Shymanovich, U, Krzywinski, J, Hau-Riege, S, London, R, Gleeson, A, Gullikson, E M, Bijkerk, F

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Time-Resolved XUV Opacity Measurements of Warm Dense Aluminum von Vinko, S. M., Vozda, V., Andreasson, J., Bajt, S., Bielecki, J., Burian, T., Chalupsky, J., Ciricosta, O., Desjarlais, M. P., Fleckenstein, H., Hajdu, J., Hajkova, V., Hollebon, P., Juha, L., Kasim, M. F., McBride, E. E., Muehlig, K., Preston, T. R., Rackstraw, D. S., Roling, S., Toleikis, S., Wark, J. S., Zacharias, H.

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Measurements of continuum lowering in solid-density plasmas created from elements and compounds von Ciricosta, O., Vinko, S. M., Barbrel, B., Rackstraw, D. S., Preston, T. R., Burian, T., Chalupský, J., Cho, B. I., Chung, H. -K., Dakovski, G. L., Engelhorn, K., Hájková, V., Heimann, P., Holmes, M., Juha, L., Krzywinski, J., Lee, R. W., Toleikis, S., Turner, J. J., Zastrau, U., Wark, J. S.

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Soft x-ray free electron laser microfocus for exploring matter under extreme conditions von Nelson, A J, Toleikis, S, Chapman, H, Bajt, S, Krzywinski, J, Chalupsky, J, Juha, L, Cihelka, J, Hajkova, V, Vysin, L, Burian, T, Kozlova, M, Fäustlin, R R, Nagler, B, Vinko, S M, Whitcher, T, Dzelzainis, T, Renner, O, Saksl, K, Khorsand, A R, Heimann, P A, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J, Iwan, B, Andreasson, J, Timneanu, N, Fajardo, M, Wark, J S, Riley, D, Tschentscher, T, Hajdu, J, Lee, R W

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Direct measurements of the ionization potential depression in a dense plasma von Ciricosta, O, Vinko, S M, Chung, H-K, Cho, B-I, Brown, C R D, Burian, T, Chalupský, J, Engelhorn, K, Falcone, R W, Graves, C, Hájková, V, Higginbotham, A, Juha, L, Krzywinski, J, Lee, H J, Messerschmidt, M, Murphy, C D, Ping, Y, Rackstraw, D S, Scherz, A, Schlotter, W, Toleikis, S, Turner, J J, Vysin, L, Wang, T, Wu, B, Zastrau, U, Zhu, D, Lee, R W, Heimann, P, Nagler, B, Wark, J S

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Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser von Hau-Riege, S P, London, R A, Graf, A, Baker, S L, Soufli, R, Sobierajski, R, Burian, T, Chalupsky, J, Juha, L, Gaudin, J, Krzywinski, J, Moeller, S, Messerschmidt, M, Bozek, J, Bostedt, C

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Saturation of a Ce:Y3Al5O12 scintillator response to ultra-short pulses of extreme ultraviolet soft X-ray and X-ray laser radiation von Krzywinski, J., Andrejczuk, A., Bionta, R. M., Burian, T., Chalupsky, J., Jurek, M., Kirm, M., Nagirnyi, V., Sobierajski, R., Tiedtke, K., Vielhauer, S., Juha, L.

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Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources von Sobierajski, R, Bruijn, S, Khorsand, A R, Louis, E, van de Kruijs, R W E, Burian, T, Chalupsky, J, Cihelka, J, Gleeson, A, Grzonka, J, Gullikson, E M, Hajkova, V, Hau-Riege, S, Juha, L, Jurek, M, Klinger, D, Krzywinski, J, London, R, Pelka, J B, Płociński, T, Rasiński, M, Tiedtke, K, Toleikis, S, Vysin, L, Wabnitz, H, Bijkerk, F

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Saturable absorption of an x-ray free-electron-laser heated solid-density aluminum plasma von Rackstraw, D S, Ciricosta, O, Vinko, S M, Barbrel, B, Burian, T, Chalupský, J, Cho, B I, Chung, H-K, Dakovski, G L, Engelhorn, K, Hájková, V, Heimann, P, Holmes, M, Juha, L, Krzywinski, J, Lee, R W, Toleikis, S, Turner, J J, Zastrau, U, Wark, J S

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An interplay of various damage channels in polyethylene exposed to ultra-short XUV/X-ray pulses von Medvedev, N, Babaev, P, Chalupský, J, Juha, L, Volkov, A. E

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Photon energy dependence of graphitization threshold for diamond irradiated with an intense XUV FEL pulse von Gaudin, J., Medvedev, N., Chalupský, J., Burian, T., Dastjani-Farahani, S., Hájková, V., Harmand, M., Jeschke, H. O., Juha, L., Jurek, M., Klinger, D., Krzywinski, J., Loch, R. A., Moeller, S., Nagasono, M., Ozkan, C., Saksl, K., Sinn, H., Sobierajski, R., Sovák, P., Toleikis, S., Tiedtke, K., Toufarová, M., Tschentscher, T., Vorlíček, V., Vyšín, L., Wabnitz, H., Ziaja, B.

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In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source von Gerasimova, N., Dziarzhytski, S., Weigelt, H., Chalupský, J., Hájková, V., Vyšín, L., Juha, L.

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Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities von Wierzchowski, W., Wieteska, K., Sobierajski, R., Klinger, D., Pełka, J., Żymierska, D., Paulmann, C., Hau-Riege, S.P., London, R.A., Graf, A., Burian, T., Chalupský, J., Gaudin, J., Krzywinski, J., Moeller, S., Messerschmidt, M., Bozek, J., Bostedt, Ch

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