Threshold voltage instability and polyimide charging effects of LTPS TFTs for flexible displays von Kim, Hyojung, Park, Jongwoo, Khim, Taeyoung, Bak, Sora, Song, Jangkun, Choi, Byoungdeog

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Optimization of Pupil Fit Parameters for Contact Hole Pattern CD Difference Improvement von Lee, Heehong, Rah, Hyungju, Lee, Hyosung, Sohn, Jaewoong, Choi, Byoungdeog

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Effects of polyimide curing on image sticking behaviors of flexible displays von Kim, Hyojung, Park, Jongwoo, Bak, Sora, Park, Jungmin, Byun, Changwoo, Oh, Changyong, Kim, Bo Sung, Han, Chanhee, Yoo, Jongmin, Kim, Dongbhin, Song, Jangkun, Choi, Pyungho, Choi, Byoungdeog

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Evaluation of Minority Carrier Generation Lifetime for Oxide Semiconductors von Choi, Pyungho, Lee, Sangmin, Kim, Hyojung, Park, Jungmin, Choi, Byoungdeog

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Enhanced Hole Injection Characteristics of a Top Emission Organic Light-Emitting Diode with Pure Aluminum Anode von Park, Chan Young, Choi, Byoungdeog

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Enhanced Light Extraction from Bottom Emission OLEDs by High Refractive Index Nanoparticle Scattering Layer von Park, Chan Young, Choi, Byoungdeog

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A Study on the Charge Trapping Characteristics of High-k Laminated Traps von Yoo, Jinhyuk, Kim, SoonKon, Jeon, Woojin, Park, Areum, Choi, Donghee, Choi, Byoungdeog

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Effect of ALD- and PEALD- Grown Al2O3 Gate Insulators on Electrical and Stability Properties for a-IGZO Thin-Film Transistor von Park, Jungmin, Kim, Hyojung, Choi, Pyungho, Jeon, Bohyeon, Lee, Jongyoon, Oh, Changyong, Kim, Bosung, Choi, Byoungdeog

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Conduction band offset-dependent induced threshold voltage shifts in a-InGaZnO TFTs under positive bias illumination stress von Kim, Hyojung, Kim, Soonkon, Yoo, Jongmin, Oh, Changyong, Kim, Bosung, Hwang, Hyuncheol, Park, Jungmin, Choi, Pyungho, Song, Jangkun, Im, Kiju, Choi, Byoungdeog

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Novel STI Technology for Enhancing Reliability of High-k/Metal Gate DRAM von Park, Hyojin, Kil, Gyuhyun, Sung, Wonju, Han, Junghoon, Song, Jungwoo, Choi, Byoungdeog

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Charging Compensation Layer on Polyimide for Enhanced Device Stability in Flexible Technology von Kim, Hyojung, Park, Jongwoo, Park, Jungmin, Woo, Hyuntaek, Lee, Jongyoon, Park, Yoonsoo, Khim, Taeyoung, Kim, Junehwan, Lee, Jaeseob, Song, Jangkun, Choi, Byoungdeog

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Highly Stackable 3D Capacitor-less DRAM for a High-performance Hybrid Memory von Lee, Seungmin, Choi, Byoungdeog

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String-level compact modeling of erase operations in the body-floated vertical channel of 3D charge trapping flash memory von Cho, Sunghwan, Choi, Byoungdeog

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Maximizing the Productivity of Photolithography Equipment by Machine Learning Based on Time Analytics von Jung, Juyoung, Hong, Jin-Hwan, Suk, Jeewoong, Park, Hyunsoon, Choi, Byoungdeog

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String-level compact modeling for dynamic operation and transient analysis of 3D charge trapping flash memory von Cho, Sunghwan, Choi, Byoungdeog

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Electrical evaluation of the crystallization characteristics of excimer laser annealed polycrystalline silicon active layer von Koo, Kwangjun, Kim, Sangsub, Choi, Pyungho, Kim, Jaejin, Jang, Keunho, Choi, Byoungdeog

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Novel Dual Work Function Buried Channel Array Transistor Process Design for Sub-17 nm DRAM von Park, Dong-Sik, Im, Dong-Hyun, Kim, Yun-Jung, Sam Lee, Sung, Kang, Byung-Jae, Seo, Jae-Hong, Koo, Taewoong, Choi, Byoungdeog

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Electrical characterization of electron beam induced damage on sub-10 nm n-channel MOS transistors using nano-probing technique von Kang, Jonghyuk, Lee, Sungho, Choi, Byoungdeog

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Effects of Channel Type and Doping on Hysteresis in Low-Temperature Poly-Si Thin-Film Transistors von Lee, Jaeseob, Choi, Byoungdeog

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A Study of High-Voltage p-Type MOSFET Degradation Under AC Stress von Lee, Dongjun, Lee, Chiwoo, Lee, Changsub, Hur, Sunghoi, Song, Duheon, Choi, Junghyuk, Choi, Byoungdeog

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