A SPICE model for design of threshold current controlled memristive devices based applications von de Souza Dias, Cesar, Butzen, Paulo F.

Volltext

A Predictive Approach for Conditional Execution of Memristive Material Implication Stateful Logic Operations von Dias, Cesar de S., Marranghello, Felipe S., Brum, Raphael Martins, Butzen, Paulo F.

Volltext

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems von Balen, Tiago R., González, Carlos J., Oliveira, Ingrid F. V., da Rosa Jr, Leomar S., Soares, Rafael I., Schvittz, Rafael B., Added, Nemitala, Macchione, Eduardo L. A., Aguiar, Vitor A. P., Guazzelli, Marcilei A., Medina, Nilberto H., Butzen, Paulo F.

Volltext

BTI, HCI and TDDB aging impact in flip–flops von Nunes, Cícero, Butzen, Paulo F., Reis, André I., Ribas, Renato P.

Volltext

Standby power consumption estimation by interacting leakage current mechanisms in nanoscaled CMOS digital circuits von Butzen, Paulo F., da Rosa, Leomar S., Chiappetta Filho, Erasmo J.D., Reis, André I., Ribas, Renato P.

Volltext

Efficient Memristive Stateful Logic Exploring Boolean Expressions in the Sum-of-Products Form von Dias, Cesar de S., de Lima, Helisa S., Brum, Raphael M., Butzen, Paulo F.

Volltext

Optimizing machine learning logic circuits with constant signal propagation von Berndt, Augusto, Meinhardt, Cristina, Reis, Andre I., Butzen, Paulo F.

Volltext

Transistor network restructuring against NBTI degradation von Butzen, Paulo F., Bem, Vinícius Dal, Reis, André I., Ribas, Renato P.

Volltext

Routing Resistance Influence in Loading Effect on Leakage Analysis von Butzen, Paulo F., Reis, André I., Ribas, Renato P.

Volltext

Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization von Rai, Shubham, Neto, Walter Lau, Miyasaka, Yukio, Zhang, Xinpei, Yu, Mingfei, Fujita, Qingyang Yi Masahiro, Manske, Guilherme B, Pontes, Matheus F, Junior, Leomar S. da Rosa, de Aguiar, Marilton S, Butzen, Paulo F, Chien, Po-Chun, Huang, Yu-Shan, Wang, Hoa-Ren, Jiang, Jie-Hong R, Gu, Jiaqi, Zhao, Zheng, Jiang, Zixuan, Pan, David Z, de Abreu, Brunno A, Campos, Isac de Souza, Berndt, Augusto, Meinhardt, Cristina, Carvalho, Jonata T, Grellert, Mateus, Bampi, Sergio, Lohana, Aditya, Kumar, Akash, Zeng, Wei, Davoodi, Azadeh, Topaloglu, Rasit O, Zhou, Yuan, Dotzel, Jordan, Zhang, Yichi, Wang, Hanyu, Zhang, Zhiru, Tenace, Valerio, Gaillardon, Pierre-Emmanuel, Mishchenko, Alan, Chatterjee, Satrajit

Volltext bestellen

Subthreshold Leakage Modeling and Estimation of General CMOS Complex Gates von Butzen, Paulo F., Reis, André I., Kim, Chris H., Ribas, Renato P.

Volltext

Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization von Rai, Shubham, Walter Lau Neto, Miyasaka, Yukio, Zhang, Xinpei, Yu, Mingfei, Qingyang Yi Masahiro Fujita, Manske, Guilherme B, Pontes, Matheus F, Leomar S da Rosa Junior, de Aguiar, Marilton S, Butzen, Paulo F, Po-Chun Chien, Yu-Shan, Huang, Hoa-Ren, Wang, Jiang, Jie-Hong R, Gu, Jiaqi, Zhao, Zheng, Jiang, Zixuan, Pan, David Z, de Abreu, Brunno A, Isac de Souza Campos, Berndt, Augusto, Meinhardt, Cristina, Carvalho, Jonata T, Mateus Grellert, Bampi, Sergio, Lohana, Aditya, Kumar, Akash, Zeng, Wei, Davoodi, Azadeh, Topaloglu, Rasit O, Zhou, Yuan, Dotzel, Jordan, Zhang, Yichi, Wang, Hanyu, Zhang, Zhiru, Tenace, Valerio, Pierre-Emmanuel Gaillardon, Mishchenko, Alan, Chatterjee, Satrajit

Volltext

Modeling Subthreshold Leakage Current in General Transistor Networks von Butzen, P.F., Reis, A.I., Kim, C.H., Ribas, R.P.

Volltext

Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions von Marques, Cleiton Magano, Meinhardt, Cristina, Butzen, Paulo Francisco

Volltext

Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation von Schvittz, R.B., Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Rosa, L.S., Butzen, P.F.

Volltext

An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization von Keane, J, Venkatraman, S, Butzen, P, Kim, C H

Volltext

Impact and optimization of lithography-aware regular layout in digital circuit design von Dal Bem, V., Butzen, P., Marranghello, F. S., Reis, A. I., Ribas, R. P.

Volltext

Comparison between linear and nonlinear systems of feed formulation for broilers von Dadalt, JC, Butzen, FM, Ribeiro, AML, Renz, SV, Kessler, A de M, Penz Júnior, AM

Volltext

Orders of magnitude increase in soil erosion associated with land use change from native to cultivated vegetation in a Brazilian savannah environment von Oliveira, Paulo Tarso S., Nearing, Mark A., Wendland, Edson

Volltext

Land management impacts on soil properties and initial soil erosion processes in olives and vegetable crops von Bogunovic, Igor, Telak, Leon Josip, Pereira, Paulo, Filipovic, Vilim, Filipovic, Lana, Percin, Aleksandra, Durdevic, Boris, Birkás, Márta, Dekemati, Igor, Comino, Jesus Rodrigo

Volltext