Comparison of calibration methods for atomic-force microscopy cantilevers von Burnham, N A, Chen, X, Hodges, C S, Matei, G A, Thoreson, E J, Roberts, C J, Davies, M C, Tendler, S J B

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Annealing effects on interdiffusion in layered FA-rich perovskite solar cells von Oyewole, D. O., Koech, R. K., Ichwani, R., Ahmed, R., Hinostroza Tamayo, J., Adeniji, S. A., Cromwell, J., Colin Ulloa, E., Oyewole, O. K., Agyei-Tuffour, B., Titova, L. V., Burnham, N. A., Soboyejo, W. O.

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The role of few-asperity contacts in adhesion von Thoreson, E.J., Martin, J., Burnham, N.A.

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Microstructural Evolution of Asphalt Binder under Combined Action of Moisture and Pressure von Nivedya, M. K, Trottier, T. G, Yu, X, Tao, M, Burnham, N. A, Mallick, R. B

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How does a tip tap? von Burnham, N A, Behrend, O P, Oulevey, F, Gremaud, G, Gallo, P-J, Gourdon, D, Dupas, E, Kulik, A J, Pollock, H M, Briggs, G A D

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Friction Anisotropy and Asymmetry of a Compliant Monolayer Induced by a Small Molecular Tilt von Liley, M., Gourdon, D., Stamou, D., Meseth, U., Fischer, T. M., Lautz, C., Stahlberg, H., Vogel, H., Burnham, N. A., Duschl, C.

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Interpretation of force curves in force microscopy von Burnham, N A, Colton, R J, Pollock, H M

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Recommendations for the Use of an Atomic Force Microscope as an In-Fab Stiction Monitor von Thoreson, E.J., Martin, J., Burnham, N.A.

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Optimizing phase imaging via dynamic force curves von Chen, X., Davies, M.C., Roberts, C.J., Tendler, S.J.B., Williams, P.M., Burnham, N.A.

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Atomistic Mechanisms and Dynamics of Adhesion, Nanoindentation, and Fracture von Landman, Uzi, Luedtke, W. D., Burnham, Nancy A., Colton, Richard J.

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Optimal roughness for minimal adhesion von Liu, D.-L., Martin, J., Burnham, N. A.

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NON‐DESTRUCTIVE INVESTIGATIONS OF THE THERMAL MATURITY AND MECHANICAL PROPERTIES OF SOURCE ROCKS von Eichmann, S. L., Jacobi, D., Haque, M. H., Burnham, N.A.

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Precision and accuracy of thermal calibration of atomic force microscopy cantilevers von Matei, G. A., Thoreson, E. J., Pratt, J. R., Newell, D. B., Burnham, N. A.

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Work-function anisotropies as an origin of long-range surface forces von BURNHAM, N. A, COLTON, R. J, POLLOCK, H. M

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Dynamic mechanical analysis at the submicron scale von Oulevey, F., Burnham, N.A., Gremaud, G., Kulik, A.J., Pollock, H.M., Hammiche, A., Reading, M., Song, M., Hourston, D.J.

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Model for mechanical properties nanoprobes von Burnham, N. A., Baker, S. P., Pollock, H. M.

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Martensitic transformation of NiTi studied at the nanometer scale by local mechanical spectroscopy von Oulevey, F., Gremaud, G., Mari, D., Kulik, A.J., Burnham, N.A., Benoit, W.

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Apparent and true feature heights in force microscopy von BURNHAM, N. A

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Electrical-conductivity SFM study of an ultrafiltration membrane von Gallo, P-J, Kulik, A J, Burnham, N A, Oulevey, F, Gremaud, G

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Phase imaging: Deep or superficial? von Behrend, O. P., Odoni, L., Loubet, J. L., Burnham, N. A.

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