Self-heating effects in SOI MOSFETs and their measurement by small signal conductance techniques von Tenbroek, B.M., Lee, M.S.L., Redman-White, W., Bunyan, J.T., Uren, M.J.

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Deformation behaviour of polysilicon components for MEMS von Lockwood, A J, Padmanabhan, A, Bunyan, R J T, Inkson, B J

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Cyclic deformation and nano-contact adhesion of MEMS nano-bridges by in-situ TEM nanomechanical testing von Lockwood, A J, Bobji, M S, Bunyan, R J T, Inkson, B J

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Sensor testing through bias superposition von Jeffrey, C., Dumas, N., Xu, Z., Mailly, F., Azaïs, F., Nouet, P., Bunyan, R.J.T., King, D.O., Mathias, H., Gilles, J.P., Richardson, A.M.D.

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Online Testing of MEMS Based on Encoded Stimulus Superposition von Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R. J. T., Richardson, A.

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Versatile high voltage level shift and driver for MEMS applications von Saul, P.H., Brunson, K.M., Bunyan, R.J.T.

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The effect of conformal roughness on spin-valves von Clarke, J, Marrows, C H, Stanley, F E, Bunyan, R J T, Tanner, B K, Hickey, B J

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Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs von Bunyan, R.J.T., Uren, M.J., Alderman, J.C., Eccleston, W.

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Analogue design issues for low-power SOI CMOS von Redman-White, W, Tenbroek, BM, Lee, MSL, Edwards, CF, Uren, MJ, Bunyan, RJT

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Degradation in thin-film SOI MOSFET's caused by single-transistor latch von Bunyan, R.J.T., Uren, M.J., Thomas, N.J., Davis, J.R.

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A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus von Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R.J.T., Richardson, A.

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Micro electromechanical system switch von BUNYAN ROBERT J.T, COMBES DAVID J, BRUNSON KEVIN M

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Single-transistor latch induced degradation in thin-film SOI MOSFETs: implications for sub-micron SOI MOSFETs von Bunyan, R. J. T., Uren, M. J., McDaid, L., Hall, S., Eccleston, W., Thomas, N., Davis, J. R.

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