High electron mobility of epitaxial ZnO thin films on c-plane sapphire grown by multistep pulsed-laser deposition von Kaidashev, E. M., Lorenz, M., von Wenckstern, H., Rahm, A., Semmelhack, H.-C., Han, K.-H., Benndorf, G., Bundesmann, C., Hochmuth, H., Grundmann, M.

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Ion beam sputter deposition of Ge films: Influence of process parameters on film properties von Bundesmann, C., Feder, R., Wunderlich, R., Teschner, U., Grundmann, M., Neumann, H.

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Infrared dielectric functions and phonon modes of high-quality ZnO films von Ashkenov, N., Mbenkum, B. N., Bundesmann, C., Riede, V., Lorenz, M., Spemann, D., Kaidashev, E. M., Kasic, A., Schubert, M., Grundmann, M., Wagner, G., Neumann, H., Darakchieva, V., Arwin, H., Monemar, B.

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Raman scattering in ZnO thin films doped with Fe, Sb, Al, Ga, and Li von Bundesmann, C., Ashkenov, N., Schubert, M., Spemann, D., Butz, T., Kaidashev, E. M., Lorenz, M., Grundmann, M.

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Ion beam sputtering of Ti: Influence of process parameters on angular and energy distribution of sputtered and backscattered particles von Lautenschläger, T., Feder, R., Neumann, H., Rice, C., Schubert, M., Bundesmann, C.

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Ion beam sputter deposition of Ag films: Influence of process parameters on electrical and optical properties, and average grain sizes von Bundesmann, C., Feder, R., Gerlach, J.W., Neumann, H.

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Systematic investigations of low energy Ar ion beam sputtering of Si and Ag von Feder, R., Frost, F., Neumann, H., Bundesmann, C., Rauschenbach, B.

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Energy Distribution of Secondary Particles in Ion Beam Deposition Process of Ag: Experiment, Calculation and Simulation von Bundesmann, C., Feder, R., Lautenschläger, T., Neumann, H.

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Infrared optical properties of MgxZn1−xO thin films (0⩽x⩽1): Long-wavelength optical phonons and dielectric constants von Bundesmann, C., Rahm, A., Lorenz, M., Grundmann, M., Schubert, M.

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Low-energy ion beam erosion of Si with simultaneous co-deposition of metallic surfactants: Experimental and simulated data von Linß, F., Bundesmann, C., Frost, F.

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Sputter yields of Mo, Ti, W, Al, Ag under xenon ion incidence von Tartz, M., Heyn, T., Bundesmann, C., Zimmermann, C., Neumann, H.

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Stress relaxation and optical characterization of TiO2 and SiO2 films grown by dual ion beam deposition von BUNDESMANN, C, EICHENTOPF, I.-M, MÄNDL, S, NEUMANN, H

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Systematic investigation of the properties of TiO2 films grown by reactive ion beam sputter deposition von Bundesmann, C., Lautenschläger, T., Spemann, D., Finzel, A., Thelander, E., Mensing, M., Frost, F.

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In Situ Thermal Characterization of the Accelerator Grid of an Ion Thruster von Bundesmann, C, Tartz, M, Scholze, F, Neumann, H, Leiter, H. J, Scortecci, F

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Note: An advanced in situ diagnostic system for characterization of electric propulsion thrusters and ion beam sources von Bundesmann, C., Tartz, M., Scholze, F., Leiter, H. J., Scortecci, F., Gnizdor, R. Y., Neumann, H.

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Reactive Ar ion beam sputter deposition of TiO2 films: Influence of process parameters on film properties von Bundesmann, C., Lautenschläger, T., Thelander, E., Spemann, D.

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Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry von Bundesmann, C., Ashkenov, N., Schubert, M., Rahm, A., Wenckstern, H.v., Kaidashev, E.M., Lorenz, M., Grundmann, M.

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Infrared dielectric function and phonon modes of Mg-rich cubic MgxZn1−xO(x⩾0.67) thin films on sapphire (0001) von Bundesmann, C., Schubert, M., Rahm, A., Spemann, D., Hochmuth, H., Lorenz, M., Grundmann, M.

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Infrared dielectric function and vibrational modes of pentacene thin films von Schubert, M., Bundesmann, C., Jacopic, G., Maresch, H., Arwin, H.

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Infrared dielectric functions and phonon modes of wurtzite MgxZn1−xO (x⩽0.2) von Bundesmann, C., Schubert, M., Spemann, D., Butz, T., Lorenz, M., Kaidashev, E. M., Grundmann, M., Ashkenov, N., Neumann, H., Wagner, G.

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