Metrology for the next generation of semiconductor devices von Orji, N. G., Badaroglu, M., Barnes, B. M., Beitia, C., Bunday, B. D., Celano, U., Kline, R. J., Neisser, M., Obeng, Y., Vladar, A. E.

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Development of transmon qubits solely from optical lithography on 300 mm wafers von Foroozani, N, Hobbs, C, Hung, C C, Olson, S, Ashworth, D, Holland, E, Malloy, M, Kearney, P, O'Brien, B, Bunday, B, DiPaola, D, Advocate, W, Murray, T, Hansen, P, Novak, S, Bennett, S, Rodgers, M, Baker-O'Neal, B, Sapp, B, Barth, E, Hedrick, J, Goldblatt, R, Rao, S S Papa, Osborn, K D

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Machine interference problem with a random environment von Sztrik, J., Bunday, B.D.

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Value-Added Metrology von Bunday, B., Allgair, J., Caldwell, M., Solecky, E., Archie, C., Rice, B., Singh, B., Cain, J., Emami, I.

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A new algorithm for the normal distribution function von Bunday, B. D., Bokhari, S. M. Husnain, Khan, K. H.

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Asymptotic analysis of the heterogeneous machine interference problem with random environments von Sztrik, J., Bunday, B.D.

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(Invited) Materials and Processes for Superconducting Qubits and Superconducting Electronic Circuits on 300mm Wafers von Papa Rao, Satyavolu S., Hobbs, Christopher, Olson, Stephen, Foroozani, Neda, Chong, Hyuncher, Stamper, Harlan, Martinick, Brian, Ashworth, Dominic, Bunday, Benjamin, Malloy, Matthew, Holland, Eric, Nalaskowski, Jakub, Kearney, Patrick, Ngai, Tat, Wells, Ilyssa, Yakimov, Michael, Oktyabrsky, Serge, O'Brien, Brendan, Kaushik, Vidya, Dunn, Kathleen A, Beckmann, Karsten, Bennett, Stephen, Rodgers, Martin, Murray, Thomas, Novak, Steven, Baker-O'Neal, Brett, Borst, Christopher, Osborn, Kevin D, Liehr, Michael

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Likelihood and Bayesian Estimation Methods for Poisson Process Models in Software Reliability von Bunday, B.D, Al-Ayoubi, I.D

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Publisher Correction: Metrology for the next generation of semiconductor devices von Orji, N. G., Badaroglu, M., Barnes, B. M., Beitia, C., Bunday, B. D., Celano, U., Kline, R. J., Neisser, M., Obeng, Y., Vladar, A. E.

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A note on 'A closed form solution for the G/M/r machine interference model' by B. D. Bunday and E. Khorram von BIAGINI, GIUSEPPE, GOLDFEDER, MARC E.

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The maintenance of unidirectionally patrolled stations von Bunday, Brian D., Tapsir, Ruzela

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The efficiency of M groups of N machines served by a travelling robot: comparison of two models von BUNDAY, B. D., EL-BADRI, W. K.

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Machine interference-a comparison of two patrolling methods von BUNDAY, BRIAN D., EL-BADRI, WALID K.

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The efficiency of uni-directionally patrolled machines with two robot repairmen von Bunday, Brian D., Khorram, Esmaile

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The efficiency of unidirectionally patrolled machines von Bunday, Brian D., Khorram, Esmaile

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Methods for population estimation by random sampling von Bunday, B.D.

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Efficiency of Bi-Directionally Traversed Machines von Bunday, B. D., Mack, C.

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X-ray reflectometry and x-ray fluorescence monitoring of the atomic layer deposition process for high- k gate dielectrics von Hung, P. Y., Gondran, Carolyn, Ghatak-Roy, Amiya, Terada, Shinichi, Bunday, Ben, Yeung, Henry, Diebold, Alain

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The G/M/ r machine interference model von Bunday, B.D., Scraton, R.E.

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Analysis of Censored Recidivism Data Using a Proportional Hazards-Type Model von Bunday, Brian D., Kiri, Victor A.

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