Influence of the material properties of a poly(D,L-lactide)/β-tricalcium phosphate composite on the processability by selective laser sintering von Gayer, C, Abert, C, Bullemer, M, Grom, S, Jauer, L, Meiners, W, Reinauer, F, Vučak, M, Wissenbach, K, Poprawe, R, Schleifenbaum, J.H, Fischer, H

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Genetic causes of mild hyperhomocysteinemia in patients with premature occlusive coronary artery diseases von Tsai, Michael Y., Welge, Barry G., Hanson, Naomi Q., Bignell, Michelle K., Vessey, John, Schwichtenberg, Kerry, Yang, Feng, Bullemer, Faye E., Rasmussen, Rhonda, Graham, Kevin J.

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Attentional requirements of learning: Evidence from performance measures von Nissen, Mary Jo, Bullemer, Peter

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SiC(0001)3 × 3-Si surface reconstruction — a new insight with a STM von Kulakov, M.A, Henn, G, Bullemer, B

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On the Development of Procedural Knowledge von Willingham, Daniel B, Nissen, Mary Jo, Bullemer, Peter

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Scanning tunnelling microscopy study of Si(100)-c(4 × 4) structure formation by annealing of Si epitaxial films von Zhang, Z., Kulakov, M.A., Bullemer, B.

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Epitaxial growth of ultrathin Si caps on Si(100):B surface studied by scanning tunneling microscopy von Zhang, Z., Kulakov, M. A., Bullemer, B., Eisele, I., Zotov, A. V.

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New features of C-type defects on the Si(100) surface observed by scanning tunnelling microscopy von Zhang, Z., Kulakov, M.A., Bullemer, B.

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DISPLAY FOR ELECTRODE PROXIMITY von VOTH, Eric J, BULLEMER, Beth C, GARFIELD, M Robert, SCHWEITZER, Jeffrey A, RUETZ, Linda, BETZLER, Eric J

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DISPLAY FOR ELECTRODE PROXIMITY von Garfield, M Robert, Voth, Eric J, Bullemer, Beth C, Schweitzer, Jeffrey A, Ruetz, Linda, Betzler, Eric J

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Scanning tunnelling microscopy on the 6H SiC(0001) surface von Kulakov, M.A., Heuell, P., Tsvetkov, V.F., Bullemer, B.

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Surface morphology and reconstructions of ultra thin Si films grown by solid-phase epitaxy von Zhang, Z, Kulakov, M.A, Bullemer, B

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Structural defects of the Si(111)√3×√3-B surface studied by scanning tunneling microscopy von Zotov, A.V., Kulakov, M.A., Ryzhkov, S.V., Saranin, A.A., Lifshits, V.G., Bullemer, B., Eisele, I.

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Charge transfer and rest-atom imaging in dimer-adatom-stacking-fault structure evolution observed by scanning tunnelling microscopy on the Si(111) surface von Zhang, Z., Kulakov, M.A., Bullemer, B.

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Stepped morphology on 4H and 15R silicon carbide: modelling by a random walk von Heuell, P., Kulakov, M.A., Bullemer, B.

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An adaptive scan generator for a scanning tunneling microscope von Heuell, P., Kulakov, M. A., Bullemer, B.

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An ultra-high resolution control unit for a scanning tunnelling microscope von Heuell, P., Cuzdi, S., Kulakov, M.A., Bullemer, B.

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Scanning tunnelling microscopy on quenched Si(111) surfaces von Teufel, L., Heuell, P., Kulakov, M.A., Bullemer, B.

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Morphology and atomic structure of SiC(0001) surfaces: a UHV STM study von Kulakov, M.A., Hoster, H., Henn, G., Bullemer, B.

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Cooling rate determination of Si samples in a radiative quench and observation of an apparent temperature shift of the 1 x 1-7 x 7 surface phase transition von KULAKOV, M. A, HOSTER, H, ZHANG, Z, BULLEMER, B

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