A study of interface states of directly bonded silicon-on-insulator structures von Buldygin, S.A, Golod, S.V, Kamaev, G.N, Skok, E.M

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Microwave technique for measurements of electron mobility in p-Cd xHg 1- xTe von Borodovski, P.A., Buldygin, S.A., Studenikin, S.A.

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Microwave method for the characterization of transport parameters of heterostructures and narrow gap semiconductor films von Baturina, T.I., Borodovski, P.A., Buldygin, S.A., Studenikin, S.A.

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Computer controlled microwave transient photoconductivity for the nondestructive characterization of GaAs substrates von Buldygin, S.A., Golod, S.V., Preobrazhenskii, V.V., Semyagin, B.P., Skok, E.M., Tarlo, D.G.

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Microwave technique for measurements of electron mobility in p-CdxHg1-xTe von Borodovski, P.A., Buldygin, S.A., Studenikin, S.A.

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A study of interface states of directly bonded silicon-on-insulator (SOI) structures von Buldygin, S.A., Bulycheva, T.V., Golod, S.V., Drofa, A.T., Kamaev, G.N., Skok, E.M.

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