Pain beyond monism and dualism von Williamson, Owen D., Buchanan, David A., Quintner, John L., Cohen, Milton L.

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Low-temperature deposition of stoichiometric HfO2 on silicon: Analysis and quantification of the HfO2/Si interface from electrical and XPS measurements von Rudenja, S., Minko, A., Buchanan, D.A.

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Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues von Gusev, E.P, Cartier, E, Buchanan, D.A, Gribelyuk, M, Copel, M, Okorn-Schmidt, H, D’Emic, C

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Aroma volatile biosynthesis in apples affected by 1-MCP and methyl jasmonate von Kondo, S., Setha, S., Rudell, D.R., Buchanan, D.A., Mattheis, J.P.

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Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's von Lo, S.-H., Buchanan, D.A., Taur, Y., Wang, W.

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P592The effect of a high fat diet on cardiac and adipose mesenchymal cells von Perbellini, F, Buchanan, DA, Gomes, RSM, Vieira, S, Clarke, K, Faggian, G, Carr, C A

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CMOS scaling into the nanometer regime von Yuan Taur, Wind, S.J., Hon-Sum Wong, Buchanan, D.A., Wei Chen, Frank, D.J., Ismail, K.E., Shih-Hsien Lo, Sai-Halasz, G.A., Viswanathan, R.G., Wann, H.-J.C.

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Photoluminescence from Ag super(2+) ions in lithium tetraborate (Li sub(2)B sub(4)O sub(7)) crystals von Brant, A T, Buchanan, DA, McClory, J W, Adamiv, V T, Burak, YaV, Halliburton, LE, Giles, N C

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Demands, Instabilities, Manipulations, Careers: The Lived Experience of Driving Change von Buchanan, David A.

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Self-consistent modeling of accumulation layers and tunneling currents through very thin oxides von Rana, Farhan, Tiwari, Sandip, Buchanan, D. A.

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EXAFS and EPR analysis of the local structure of Mn-doped Li sub(2)B sub(4)O sub(7) von Kelly, T D, Kong, L, Buchanan, DA, Brant, A T, Petrosky, J C, McClory, J W, Adamiv, V T, Burak, Y V, Dowben, P A

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Anode hole injection and trapping in silicon dioxide von DiMaria, D. J., Cartier, E., Buchanan, D. A.

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Passivation and depassivation of silicon dangling bonds at the Si/SiO2 interface by atomic hydrogen von CARTIER, E, STATHIS, J. H, BUCHANAN, D. A

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Performance of a multi-electrode silicon-based dielectrophoretic cage device using four electrical contacts von Masood, N., Ferrier, G.A., Thomson, D.J., Buchanan, D.A.

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The Role of Photography in Organization Research: A Reengineering Case Illustration von Buchanan, David A.

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Compatibility challenges for high-kappa materials integration into CMOS technology von Guha, S, Gusev, E, Copel, M, Ragnarsson, L-A, Buchanan, D A

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Charge trapping and detrapping in HfO2 high-κ MOS capacitors using internal photoemission von Felnhofer, D., Gusev, E.P., Jamison, P., Buchanan, D.A.

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Interface reactions in ZrO2 based gate dielectric stacks von Gribelyuk, M. A., Callegari, A., Gusev, E. P., Copel, M., Buchanan, D. A.

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Reliability and integration of ultra-thin gate dielectrics for advanced CMOS von Buchanan, D.A., Lo, S.-H.

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Low temperature chemical vapor deposition of ZrO2 on Si(100) using anhydrous zirconium(V) nitrate von SMITH, Ryan C, HOILIEN, Noel, TAYLOR, Charles J, TIEZHONG MA, CAMPBELL, Stephen A, ROBERTS, Jeffrey T, COPEL, Matthew, BUCHANAN, D. A, GRIBELYUK, Michael, GLADFELTER, Wayne L

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