Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues von Gusev, E.P, Cartier, E, Buchanan, D.A, Gribelyuk, M, Copel, M, Okorn-Schmidt, H, D’Emic, C

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High-resolution imaging of gigahertz polarization response arising from the interference of reflected surface acoustic waves von Yahyaie, I., Buchanan, D. A., Bridges, G. E., Thomson, D. J., Oliver, D. R.

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Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's von Lo, S.-H., Buchanan, D.A., Taur, Y., Wang, W.

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Passivation and depassivation of silicon dangling bonds at the Si/SiO2 interface by atomic hydrogen von CARTIER, E, STATHIS, J. H, BUCHANAN, D. A

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Self-consistent modeling of accumulation layers and tunneling currents through very thin oxides von Rana, Farhan, Tiwari, Sandip, Buchanan, D. A.

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Performance of a multi-electrode silicon-based dielectrophoretic cage device using four electrical contacts von Masood, N., Ferrier, G.A., Thomson, D.J., Buchanan, D.A.

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Charge trapping and detrapping in HfO2 high-κ MOS capacitors using internal photoemission von Felnhofer, D., Gusev, E.P., Jamison, P., Buchanan, D.A.

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EPR identification of defects responsible for thermoluminescence in Cu-doped lithium tetraborate (Li2B4O7) crystals von Brant, A.T., Buchanan, D.A., McClory, J.W., Dowben, P.A., Adamiv, V.T., Burak, Ya.V., Halliburton, L.E.

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Photoluminescence from Ag2+ ions in lithium tetraborate (Li2B4O7) crystals von Brant, A.T., Buchanan, D.A., McClory, J.W., Adamiv, V.T., Burak, Ya.V., Halliburton, L.E., Giles, N.C.

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Low temperature chemical vapor deposition of ZrO2 on Si(100) using anhydrous zirconium(V) nitrate von SMITH, Ryan C, HOILIEN, Noel, TAYLOR, Charles J, TIEZHONG MA, CAMPBELL, Stephen A, ROBERTS, Jeffrey T, COPEL, Matthew, BUCHANAN, D. A, GRIBELYUK, Michael, GLADFELTER, Wayne L

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Low-temperature deposition of stoichiometric HfO2 on silicon: Analysis and quantification of the HfO2/Si interface from electrical and XPS measurements von Rudenja, S., Minko, A., Buchanan, D.A.

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Interface and bulk trap generation in metal-oxide-semiconductor capacitors von BUCHANAN, D. A, DIMARIA, D. J

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Electron effective mass in ultrathin oxide silicon MOSFET inversion layers von Dragosavac, M, Paul, D J, Pepper, M, Fowler, A B, Buchanan, D A

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EXAFS and EPR analysis of the local structure of Mn-doped Li2B4O7 von Kelly, T. D., Kong, L., Buchanan, D. A., Brant, A. T., Petrosky, J. C., McClory, J. W., Adamiv, V. T., Burak, Y. V., Dowben, P. A.

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Interface reactions in ZrO2 based gate dielectric stacks von Gribelyuk, M. A., Callegari, A., Gusev, E. P., Copel, M., Buchanan, D. A.

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Aroma volatile biosynthesis in apples affected by 1-MCP and methyl jasmonate von Kondo, S., Setha, S., Rudell, D.R., Buchanan, D.A., Mattheis, J.P.

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Interface states induced by the presence of trapped holes near the silicon–silicon-dioxide interface von DiMaria, D. J., Buchanan, D. A., Stathis, J. H., Stahlbush, R. E.

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Unpinned gallium oxide/GaAs interface by hydrogen and nitrogen surface plasma treatment von CALLEGARI, A, HOH, P. D, BUCHANAN, D. A, LACEY, D

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Hot-electron-induced hydrogen redistribution and defect generation in metal-oxide-semiconductor capacitors von Buchanan, D. A., Marwick, A. D., DiMaria, D. J., Dori, L.

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Atomic hydrogen-induced interface degradation of reoxidized-nitrided silicon dioxide on silicon von Cartier, E., Buchanan, D. A., Dunn, G. J.

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