A New Method and Mass Spectrometer Design for TOF-SIMS Parallel Imaging MS/MS von Fisher, Gregory L, Bruinen, Anne L, Ogrinc Potočnik, Nina, Hammond, John S, Bryan, Scott R, Larson, Paul E, Heeren, Ron M.A

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Forecasts for broad-band intensity mapping of the ultraviolet-optical background with CASTOR and SPHEREx von Scott, Bryan R, Upton Sanderbeck, Phoebe, Bird, Simeon

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Revisiting the [C  ii ] 158 μm line-intensity mapping power spectrum from the EoR using non-uniform line-luminosity scatter von Murmu, Chandra Shekhar, Olsen, Karen P, Greve, Thomas R, Majumdar, Suman, Datta, Kanan K, Scott, Bryan R, Leung, T K Daisy, Davé, Romeel, Popping, Gergö, Ochoa, Raul Ortega, Vizgan, David, Narayanan, Desika

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Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams von Miyayama, Takuya, Sanada, Noriaki, Bryan, Scott R., Hammond, John S., Suzuki, Mineharu

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Parallel imaging MS/MS TOF-SIMS instrument von Fisher, Gregory L., Hammond, John S., Larson, Paul E., Bryan, Scott R., Heeren, Ron M. A.

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Prospects of passive radio detection of a subsurface ocean on Europa with a lander von Romero-Wolf, Andrew, Schroeder, Dustin M., Ries, Paul, Bills, Bruce G., Naudet, Charles, Scott, Bryan R., Treuhaft, Robert, Vance, Steve

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The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging von Fisher, Gregory L., Hammond, John S., Bryan, Scott R., Larson, Paul E., Heeren, Ron M. A.

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A Revolutionary Approach for Molecular Imaging with TOF-SIMS Parallel Imaging MS/MS von Hammond, John S., Fisher, Gregory L., Larson, Paul E., Bryan, Scott R.

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Rotation models for the Galilean satellites von Bills, Bruce G., Scott, Bryan R.

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Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams von Iida, Shin-ichi, Miyayama, Takuya, Sanada, Noriaki, Suzuki, Mineharu, Fisher, Gregory L., Bryan, Scott R.

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Extraction of inhomogeneous chemical species from TOF-SIMS images with topographic artifacts by using correlation coefficient mapping von Iida, Shin-ichi, Sanada, Noriaki, Bryan, Scott R., Suzuki, Mineharu

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C60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentation von Fisher, Gregory L., Dickinson, Michelle, Bryan, Scott R., Moulder, John

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Optimizing C60 incidence angle for polymer depth profiling by ToF-SIMS von Iida, Shin-ichi, Miyayama, Takuya, Sanada, Noriaki, Suzuki, Mineharu, Fisher, Gregory L., Bryan, Scott R.

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Cost details from front-end engineering design of piperazine with the advanced stripper von Rochelle, Gary T., Closmann, Fred, Abreu, Miguel, Babu, Athreya Suresh, Drewry, Benjamin, Gao, Tianyu, Steen, William A., Farmer, Karen, Bryan, Scott R., Bernau, Max, Sexton, Andrew, Dombrowski, Katherine, Jones, Rosalind, Marsh, Michael, Piggott, Brad, Myers, Duane

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C 60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentation von Fisher, Gregory L., Dickinson, Michelle, Bryan, Scott R., Moulder, John

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Sub-Micron Resolution Imaging with Bio-Molecular Identification by TOF-SIMS Parallel Imaging MS/MS von Fisher, Gregory L., Potočnik, Nina Ogrinc, Bruinen, Anne L., Hammond, John S., Bryan, Scott R, Heeren, Ron M.A.

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A holistic exploration of the potentially recoverable redshift information of Stage IV galaxy surveys von Scott, Bryan R, Malz, Alex I, Sorba, Robert

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Chemical Structure Analyses of Organic Materials Using TOF-SIMS Equipped with MS/MS von IIDA, Shin-ichi, FISHER, Gregory L., HAMMOND, John S., BRYAN, Scott R., MIYAYAMA, Takuya

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Secondary ion imaging of heterogeneous organic polymer films von Simko, Steven J, Bryan, Scott R, Griffis, Dieter P, Murray, Royce W, Linton, Richard W

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Chemical Structure Analyses of Organic Materials Using TOF-SIMS Equipped with MS/MS von IIDA, Shin-ichi, FISHER, Gregory L., HAMMOND, John S., BRYAN, Scott R., MIYAYAMA, Takuya

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