Combined multiplet theory and experiment for the Fe 2p and 3p XPS of FeO and Fe2O3 von Bagus, Paul S., Nelin, Connie J., Brundle, C. R., Crist, B. Vincent, Lahiri, N., Rosso, Kevin M.

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A New Mechanism For XPS Line Broadening: The 2p-XPS of Ti(IV) von Bagus, Paul S, Nelin, Connie J, Brundle, C. R, Chambers, Scott A

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Covalency in Fe2O3 and FeO: Consequences for XPS satellite intensity von Bagus, Paul S., Nelin, Connie J., Brundle, C. R., Vincent Crist, B., Lahiri, N., Rosso, Kevin M.

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A rigorous non-empirical theoretical analysis of the 2p XPS of NiO: Is it necessary to invoke nonlocal screening? von Bagus, Paul S., Brundle, Christopher R., Ilton, Eugene S.

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Many-body effects for the Mg 2s XPS of MgO von Bagus, Paul S., Nelin, Connie J., Brundle, C. R., Vincent Crist, B.

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Use of Si KLL Auger shifts and the Auger parameter in XPS to distinguish Ti silicides from a Ti/Si mixture in thin films von Saheli, Ghazal, Kuratomi, Takashi, Chen, I-cheng, Mack, Paul, LaziK, Christopher, Anthis, Jeffrey, Thompson, David M., Brundle, Christopher R.

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Nonplanarity in hexafluorobutadiene as revealed by photoelectron and optical spectroscopy von Brundle, Christopher R, Robin, Melvin B

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Experimental and theoretical comparison of the electronic structures of ethylene and diborane von Brundle, Christopher R, Robin, Melvin B, Basch, Harold, Pinsky, M, Bond, A

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Search for strongly adsorbed CO at Cu single crystal surfaces using ultraviolet photoelectron spectroscopy von Küppers, Jürgen, Nitschké, Felix, Wandelt, Klaus, Ertl, Gerhard, Brundle, Christopher R.

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Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements von Baer, Donald R., Artyushkova, Kateryna, Richard Brundle, Christopher, Castle, James E., Engelhard, Mark H., Gaskell, Karen J., Grant, John T., Haasch, Richard T., Linford, Matthew R., Powell, Cedric J., Shard, Alexander G., Sherwood, Peter M. A., Smentkowski, Vincent S.

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Process for accelerating Pd/Sn seeds for electroless copper plating von AUERBACH, DANIEL J, BRUNDLE, CHRISTOPHER R, ALNOT, PATRICK R, MILLER, DOLORES C

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Proliferation of Faulty Materials Data Analysis in the Literature von Linford, Matthew R, Smentkowski, Vincent S, Grant, John T, Brundle, C Richard, Sherwood, Peter M A, Biesinger, Mark C, Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F, Easton, Christopher D, Gengenbach, Thomas R, Major, George H, Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J, Gaskell, Karen J, Baer, Donald R

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Characterization of film materials in wafer processing technology development by XPS von Saheli, Ghazal, Liu, Wei, Lazik, Christopher, Uritsky, Yuri, Bevan, Malcolm, Tang, Wei, Ma, Paul, Venkatasubramanian, Eswaranand, Bobek, Sarah, Kulshreshtha, Prashant, Brundle, C.R.

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Erratum: “Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements” [J. Vac. Sci. Technol. A 37, 031401 (2019)]... von Baer, Donald R., Artyushkova, Kateryna, Richard Brundle, Christopher, Castle, James E., Engelhard, Mark H., Gaskell, Karen J., Grant, John T., Haasch, Richard T., Linford, Matthew R., Powell, Cedric J., Shard, Alexander G., Sherwood, Peter M. A., Smentkowski, Vincent S.

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